80 resultados para undue influence
Resumo:
The structure of the inhibition patterns is important to the stimulated emission depletion (STED) microscopy. Usually, Laguerre-Gaussian (LG) beam and the central zero-intensity patterns created by inserting phase masks in Gaussian beams are used as the erase beam in STED microscopy. Aberration is generated when focusing beams through an interface between the media of the mismatched refractive indices. By use of the vectorial integral, the effects of such aberration on the shape of depletion patterns and the size of fluorescence emission spot in the STED microscopy are studied. Results are presented as a comparison between the aberration-free case and the aberrated cases. (C) 2009 Optical Society of America
Resumo:
Pseudo-thermal light has been widely used in ghost imaging experiments. In order to understand the differences between the pseudo-thermal source and thermal source, we propose a method to investigate whether a light source has cross spectral purity (CSP), and experimentally measure the cross spectral properties of the pseudo-thermal light source in near-field and far-field zones. Moreover we present a theoretical analysis of the cross spectral influence on ghost imaging. (c) 2006 Elsevier B.V. All rights reserved.
Resumo:
The spatial longitudinal coherence length (SLCL), which is determined by the size of and the distance from the source, is introduced to investigate the longitudinal resolution of lensless ghost imaging. Its influence is discussed quantitatively by simulation. The discrepancy of position sensitivity between Scareelli et al. [Appl. Phys. Lett. 88, 061106 (2006)] and Basano and Ottonello [Appl. Phys. Lett. 88, 091109 (2006)] is clarified. (C) 2008 Optical Society of America.