FABRICATION AND CHARACTERIZATION OF TIPS FOR ELECTROCHEMICAL SCANNING-TUNNELING-MICROSCOPY

We report a new technique for preparing tips for electrochemical scanning tunneling microscopy (ECSTM) with particular consideration of its simplicity and reproducibility. In preparing scanning tunneling microscopy (STM) tips by electrochemical etching, w

IN-SITU SCANNING TUNNELING MICROSCOPIC STUDY OF NICKEL ELECTRODEPOSITION ON HOPG

The early stages of the electrodeposition of nickel on highly oriented pyrolytic graphite (HOPG) were investigated by in situ scanning tunnelling microscopy, scanning electron microscopy and electrochemical measurements. Experimental results showed that t

DIRECT OBSERVATION OF NATIVE AND UNFOLDED GLUCOSE-OXIDASE STRUCTURES BY SCANNING-TUNNELING-MICROSCOPY

Native and unfolded glucose oxidase (GOD) structures have been directly observed with scanning tunnelling microscopy (STM) for the first time. STM images show an opening butterfly-shaped pattern for the native GOD. When GOD molecules are extended on anodi

ELECTROCHEMICAL SCANNING-TUNNELING-MICROSCOPY

An ECSTM apparatus with an ideal tip using a homemade SSX-1A STM instrument has been constructed. STM and ECSTM tips were made by electrochemical etching and insulating with paraffin, silicon rubber or epoxy resin under an optical microscope. In situ imag

Supermedia User Interface for Scanning Probe Microscopy

当利用扫描隧道显微镜(SPM)作为一种纳米操作工具时,由于其缺乏实时的传感器信息反馈,而大大阻碍了它的广泛应用.利用超媒体人机交互接口可以解决这个问题.在纳米操作过程中,超媒体接口不但可以为操作者提供可实时更新的仿真操作场景,还可以通过力反馈手柄让操作者实时地感受到探针受到的三维纳米操作力.除此之外,操作者还可以通过该手柄直接控制探针的三维运动.最后在聚碳酸酯上进行了超媒体人机接口的纳米刻画实验.实验结果验证了该系统的有效性和效率.

Resolution deterioration in emission electron microscopy due to object roughness

In the present paper a general analytic expression has been obtained and confirmed by a computer simulation which links the surface roughness of an object under study in an emission electron microscope and it's resolution. A quantitative derivation was made for the model case when there is a step on the object surface. It was shown that the resolution is deteriorated asymmetrically relative to the step. The effect sets a practical limit to the ultimate lateral resolution obtainable in an emission electron microscope.

Imaging of three-dimensional objects in emission electron microscopy

Under investigation by emission electron microscopy, the shape and size of three-dimensional objects are distorted because of the appearance of a characteristic potential relief and a possible contact potential difference between the particles and the substrate. An estimation of these effects for spherical particles is made. It is shown that the apparent size of particles observed in an emission electron microscope (EEM) could be increased as well as decreased depending on the relation between the work functions of the particle and the substrate. The corresponding formulae are given and several possibilities are shown which permit us to determine from the EEM image the real size of particles and their work function relative to the substrate.