High-efficiency diffraction gratings in fused silica at the wavelength of 632.8 nm

We describe high-efficiency diffraction gratings fabricated in fused silica at the wavelength of 632.8 nm by rigorous coupled-wave analysis (RCWA). High-density holographic gratings, if the groove density falls within the range of 1575-1630 lines/mm and the groove depth within the range of 1.1-1.3 microns, can realize high diffraction efficiencies at the wavelength of 632.8 nm, e.g., the first Bragg diffraction efficiency can theoretically achieve more than 93% both in TE- and TM-polarized incidences, which greatly reduces the polarization-dependent losses. Note that with different groove profiles further optimized, the maximum efficiency of more than 99.69% can be achieved for TM-polarized incidence, or 97.81% for TE-polarized incidence.

单晶集成的1×N电光开关

为了使光学系统更加紧凑化和稳定化，本文提出了一种单晶集成的1×N电光开关：它有2个折射面，4个互相垂直的全内反射面，和N-1个电光调制器．还得到了该种1×N电光开关的构成条件：发生两相邻反射的反射面必须互相垂直．并对晶体的结构进行了优化，通过调整光束输出面与光轴的夹角来改变光束出射角，使得接收端易于接收输出的光信号．给出1×3电光开关的实例．

Bragg diffraction of multilayer volume holographic gratings under ultrashort laser pulse readout

The multilayer coupled wave theory is extended to systematically investigate the diffraction properties of multilayer volume holographic gratings (MVHGs) under ultrashort laser pulse readout. Solutions for the diffracted and transmitted intensities, diffraction efficiency, and the grating bandwidth are obtained in transmission MVHGs. It is shown that the diffraction characteristics depend not only on the input pulse duration but also on the number and thickness of grating layers and the gaps between holographic layers. This analysis can be implemented as a useful tool to aid with the design of multilayer volume grating-based devices employed in optical communications, pulse shaping, and processing. (C) 2008 Optical Society of America

Negative refraction in a honeycomb-lattice photonic crystal

In this paper we theoretically investigate a photonic crystal with dielectric rods in a honeycomb lattice. Two left-handed frequency regions are found in the second and third photonic band by using the plane wave expansion method to analyze the photonic band structure and equifrequency contours. Subwavelength imaging by the photonic crystal flat lens are systematically studied by numerical simulations using the multiple scattering method. Different from the photonic crystals with noncircular dielectric rods in air, this structure is almost isotropic at the optimal frequency for superlensing. As a comparison, flat slab focusing is also demonstrated at other frequencies in the two left-handed regions. (c) 2006 Elsevier Ltd. All rights reserved.

α-异噁唑偶氮基-β-二酮类衍生物及其互变异构体的光谱

研究了5种新型的具有不同结构的aα-异噁唑偶氮基-β-二酮类衍生物的红外光谱和紫外光谱，讨论了它们的酮式-烯醇式以及偶氮式．腙式之间的互变异构化现象。结果表明，所有化合物无论以固体形式或在溶液中均以腙式二酮体和偶氮式烯醇体的混合形式存在。各化合物的紫外吸收谱均呈双峰状，峰值分别处于246～262nm和326～339nm之间，其中，高波长吸收峰的强度明显高于低波长吸收峰强度，说明了各化合物中偶氮式烯醇体形式均多于腙式二酮体形式，其原因是由于各化合物中偶氮式烯醇体的异构体较多，且易以分子内氢键形式形成六元环，

Optical properties of nickel(II)-azo complexes thin films for potential application as high-density recordable optical recording media

Smooth thin films of three kinds of nickel(II)-azo complexes were prepared by the spin-coating method. Absorption spectra of the thin films on K9 glass substrate in the 300-600 nn wavelength region were measured. Optical constants (complex refractive index N = n + ik) and thickness of the thin films prepared on single-crystal silicon substrate in the 300-600 nm wavelength region were investigated on rotating analyzer-polarizer type of scanning ellipsometer, and dielectric constants epsilon (epsilon = epsilon(1) + i epsilon(2)), absorption coefficients a as well as reflectance R of thin films were then calculated at 405 nm. In addition, in order to examine the possible use of nickel(II)-azo complex thin film as an optical recording medium, one of the nickel(II)-azo complex thin film prepared on K9 glass substrate with an Ag reflective layer was also studied by atomic force microscopy and static optical recording. The results show that the nickel(II)-azo complex thin film is smooth and has a root mean square surface roughness of 2.25 nm, and the recording marks on the nickel(II)-azo complex thin film are very clear and circular, and their size can reach 200 nn or less. (c) 2006 Elsevier Ltd. All rights reserved.

不同产地绿松石无损检测及岩相结构特征研究

概述了绿松石的使用历史和产地来源。利用质子激发X射线荧光光谱（PIXE）、X射线衍射（XRD）及扫描电镜（SEM）技术对来自伊朗、湖北郧县和西藏等地的绿松石样品进行岩石矿物学特征分析，从成分组成方面探讨绿松石的呈色机理。结果显示，不同产地、不同质地绿松石的成分组成存在较大差别，但主成分含量基本一致；绿松石的颜色主要由其中CuO和Fe2O3的含量比值变化决定，比值由大至小，实现了绿松石颜色由天蓝色到绿色的转变。