Nonlinear propagation of ultraslow pulses in media with electromagnetically induced transparency

The nonlinear behavior of a probe pulse propagating in a medium with electromagnetically induced transparency is studied both numerically and analytically. A new type of nonlinear wave equation is proposed in which the noninstantaneous response of nonlinear polarization is treated properly. The resulting nonlinear behavior of the propagating probe pulse is shown to be fundamentally different from that predicted by the simple nonlinear Schrodinger-like wave equation that considers only instantaneous Kerr nonlinearity. (c) 2005 Optical Society of America.

Pulse shaping properties of volume holographic gratings in anisotropic media

Based on a modified coupled wave theory, the pulse shaping properties of volume holographic gratings (VHGs) in anisotropic media VHGs are studied systematically. Taking photorefractive LiNbO3 crystals as an example, the combined effect that the grating parameters, the dispersion and optical anisotropy of the crystal, the pulse width, and the polarization state of the input ultrashort pulsed beam (UPB) have on the pulse shaping properties are considered when the input UPB with arbitrary polarization state propagates through the VHG. Under the combined effect, the diffraction bandwidth, pulse profiles of the diffracted and transmitted pulsed beams, and the total diffraction efficiency are shown. The studies indicate that the properties of the shaping of the o and e components of the input UPB in the crystal are greatly different; this difference can be used for pulse shaping applications. (c) 2006 Optical Society of America.

Anisotropic diffraction of stratified volume holographic grating in photorefractive media

We have studied the anisotropic diffraction properties of the stratified volume holographic gratings recorded in photorefractive media using the anisotropic coupled wave theory. It is shown that the diffraction efficiency of such system exhibit the uniform periodic Bragg selectivity properties. In addition the dependence of the stratified volume holographic optical elements (SVHOEs) diffraction properties on the buffer-layer thickness, grating-layer thickness, number of modulation layers, and total thickness of system are discussed in detail. (c) 2005 Elsevier GrnbH. All rights reserved.

Corrections to the paraxial approximation solutions in transversely nonuniform refractive-index media

The coupled differential recurrence equations for the corrections to the paraxial approximation solutions in transversely nonuniform refractive-index media are established in terms of the perturbation method. All the corrections (including the longitudinal field corrections) to the paraxial approximation solutions are presented in the weak-guidance approximation. As a concrete application, the first-order longitudinal field correction and the second-order transverse field correction to the paraxial approximation of a Gaussian beam propagating in a transversely quadratic refractive index medium are analytically investigated. (C) 1999 Optical Society of America [S0740-3232(99)00310-5].

Spatiotemporal instabilities in nonlinear Kerr media in the presence of arbitrary higher-order dispersions

Spatiotemporal instabilities in nonlinear Kerr media with arbitrary higher-order dispersions are studied by use of standard linear-stability analysis. A generic expression for instability growth rate that unifies and expands on previous results for temporal, spatial, and spatiotemporal instabilities is obtained. It is shown that all odd-order dispersions contribute nothing to instability, whereas all even-order dispersions not only affect the conventional instability regions but may also lead to the appearance of new instability regions. The role of fourth-order dispersion in spatiotemporal instabilities is studied exemplificatively to demonstrate the generic results. Numerical simulations confirm the obtained analytic results. (C) 2002 Optical Society of America.

Optical parameters and absorption of copper (II)-azo complexes thin films as optical recording media

Smooth thin films of three kinds of azo dyes of 2-(5'-tert-butyl-3'-azoxylisoxazole)-1, 3-diketones and their copper (II)-azo complexes were prepared by the spin-coating method. Absorption spectra of the thin films on a glass substrate in the 300-600 nm wavelength region were measured. Optical constants (complex refractive index N=n+ik) and thickness of the thin films prepared on single-crystal silicon substrate in the 300-600 nm wavelength region were investigated on rotating analyzer-polarizer type of scanning ellipsometer, and dielectric constants epsilon(epsilon=epsilon(1)+i epsilon(2)), absorption coefficients alpha as well as reflectance R of thin films were then calculated. In addition, one of the copper (II)-azo complex thin film prepared on glass substrate with an Ag reflective layer was also studied by atomic force microscopy (AFM) and static optical recording. AFM study shows that the copper (II)-azo complex thin film is very smooth and has a root mean square surface roughness of 1.89 nm. Static optical recording shows that the recording marks on the copper (II)-azo complex thin film are very clear and circular, and the size of the minimal recording marks can reach 200 nm. (c) 2004 Elsevier B.V. All rights reserved.

Optical properties of nickel(II)-azo complexes thin films for potential application as high-density recordable optical recording media

Smooth thin films of three kinds of nickel(II)-azo complexes were prepared by the spin-coating method. Absorption spectra of the thin films on K9 glass substrate in the 300-600 nn wavelength region were measured. Optical constants (complex refractive index N = n + ik) and thickness of the thin films prepared on single-crystal silicon substrate in the 300-600 nm wavelength region were investigated on rotating analyzer-polarizer type of scanning ellipsometer, and dielectric constants epsilon (epsilon = epsilon(1) + i epsilon(2)), absorption coefficients a as well as reflectance R of thin films were then calculated at 405 nm. In addition, in order to examine the possible use of nickel(II)-azo complex thin film as an optical recording medium, one of the nickel(II)-azo complex thin film prepared on K9 glass substrate with an Ag reflective layer was also studied by atomic force microscopy and static optical recording. The results show that the nickel(II)-azo complex thin film is smooth and has a root mean square surface roughness of 2.25 nm, and the recording marks on the nickel(II)-azo complex thin film are very clear and circular, and their size can reach 200 nn or less. (c) 2006 Elsevier Ltd. All rights reserved.