Z-scan theory based on a diffraction model

Based on Fresnel-Mrchhoff diffraction theory, a diffraction model of nonlinear optical media interacting with a Gaussian beam has been set up that can interpret the Z-scan phenomenon in a new way. This theory not only is consistent with the conventional Z-scan theory for a small nonlinear phase shift but also can be used for larger nonlinear phase shifts. Numerical computations indicate that the shape of the Z-scan curve is greatly affected by the value of the nonlinear phase shift. The symmetric dispersionlike Z-scan curve is valid only for small nonlinear p base shifts (\Deltaphi(0)\ < pi), but, with increasingly larger nonlinear phase shifts, the valley of the transmittance is severely suppressed and the peak is greatly enhanced. The power output through the aperture will oscillate with increasing nonlinear phase shift caused by the input laser power. The aperture transmittance will attenuate and saturate with increasing Kerr constant. (C) 2003 Optical Society of America.

Application of step-scan FTIR to the research of quantum cascade lasers

The principle of step-scan Fourier transform infrared （FTIR） spectroscopy is introduced. Double modulation step-scan FTIR technique is used to obtain the quantum cascade laser＇s stacked emission spectra in the time domain. Optical property and thermal accumulation of devices due to large drive current are analyzed.

Scan test in 18x8 bits Booth Coding-Wallace Tree multiplier

Scan test can be inserted around hard IP cores that have not been designed with DFT approaches. An 18x18 bits Booth Coding-Wallace Tree multiplier has been designed with full custom approach with 0.61 m CMOS technology. When we reuse the multiplier in another chip, scan chain has been inserted around it to increase the fault coverage. After scan insertion, the multiplier needs 4.7% more areas and 24.4% more delay time, while the fault coverage reaches to 95%.