Effect of OH- content on emission properties in Er3+-doped tellurite glasses

A series of tellurite glasses of composition, 75TeO(2)-20ZnO-(5 - x)La2O3-xEr(2)O(3) (x = 0.05, 0.1, 0.3, 0.6, 1.0, 2.0, and 3.0 mol%) with different hydroxl content were prepared. The effect of Er3+ and OH- groups concentration on the emission properties of Er3+: I-4(13/2) -> I-4(15/2) transition in tellurite glasses was investigated. The constant KOH-Er for Er3+ in tellurite glasses, which represents the strength of interaction between Er3+ and OH- groups in the case of energy migration, was about 14 x 10(-19) cm(4) s(-1). The interaction parameter C-Er,C-Er for the migration rate of Er3+ : 4I(13/2) -> I-4(13/2) transition in tellurite glass was 46 x 10(-40) cm(2), which indicates that concentration quenching in Er3+-doped modified tellurite glass for a given Er3+ concentration is much stronger than in silicate and phosphate glasses. (c) 2007 Elsevier B.V. All rights reserved.

Effect of Al(PO3)(3) content on physical, chemical and optical properties of fluorophosphate glasses for 2 mu m application

The effect of Al(PO3)(3) content on physical, chemical and optical properties of fluorophosphate glasses for 2 mu m application, such as thermal stability, chemical durability, surface hardness, absorption spectra and emission spectra, is investigated. With the increment of Al(PO3)(3) content, the thermal stability characterized by the gap of T-g and T,, increases first and then decreases, and reaches the maximum level containing 5 mol% Al(PO3)(3) content. The density and chemical durability decrease monotonously with the introduction of Al(PO3)(3) content increasing, while the refractive index and surface hardness increase. Above properties of fluorophosphate glasses are also compared with fluoride glasses and phosphate glasses. The Judd-Ofelt parameters, absorption and emission cross sections are discussed based on the absorption spectra of Tm-doped glasses. The emission spectra are also measured and the 1.8 mu m fluorescence of the sample is obvious indicating that it is suitable to 2 mu m application. (c) 2008 Elsevier B.V. All rights reserved.

Influence of ytterbia content on residual stress and microstructure of Y2O3-ZrO2 thin films prepared by EB-PVD

Y2O3 stabilized ZrO2 (YSZ) thin films with different Y2O3 molar contents (0, 3, 7, and 12 mol%) are deposited on BK7 substrates by electron-beam evaporation technique. The effects of different Y2O3 contents on residual stresses and structures of YSZ thin films are studied. Residual stresses are investigated by means of two different techniques: the curvature measurement and x- ray diffraction method. It is found that the evolution of residual stresses of YSZ thin films by the two different methods is consistent. Residual stresses of films transform from compressive stress into tensile stress and the tensile stress increases monotonically with the increase of Y2O3 content. At the same time, the structures of these films change from the mixture of amorphous and monoclinic phases into high temperature cubic phase. The variations of residual stress correspond to the evolution of structures induced by adding of Y2O3 content.