Enlarging the depth of focus by filtering in the phase-space domain

The ambiguity function was employed as a merit function to design an optical system with a high depth of focus. The ambiguity function with the desired enlarged-depth-of-focus characteristics was obtained by using a properly designed joint filter to modify the ambiguity function of the original pupil in the phase-space domain. From the viewpoint of the filter theory, we roughly propose that the constraints of the spatial filters that are used to enlarge the focal depth must be satisfied. These constraints coincide with those that appeared in the previous literature on this topic. Following our design procedure, several sets of apodizers were synthesized, and their performances in the defocused imagery were compared with each other and with other previous designs. (c) 2005 Optical Society of America.

Phase-space analysis of wavefront coding imaging systems

We explore the use of the Radon-Wigner transform, which is associated with the fractional Fourier transform of the pupil function, for determining the point spread function (PSF) of an incoherant defocused optical system. Then we introduce these phase-space tools to analyse the wavefront coding imaging system. It is shown that the shape of the PSF for such a system is highly invarient to the defocous-related aberrations except for a lateral shift. The optical transfer function of this system is also investigated briefly from a new understanding of ambiguity function.

Extended bidirectional reflectance distribution function for polarized light scattering from subsurface defects under a smooth surface

By introducing the scattering probability of a subsurface defect (SSD) and statistical distribution functions of SSD radius, refractive index, and position, we derive an extended bidirectional reflectance distribution function (BRDF) from the Jones scattering matrix. This function is applicable to the calculation for comparison with measurement of polarized light-scattering resulting from a SSD. A numerical calculation of the extended BRDF for the case of p-polarized incident light was performed by means of the Monte Carlo method. Our numerical results indicate that the extended BRDF strongly depends on the light incidence angle, the light scattering angle, and the out-of-plane azimuth angle. We observe a 180 degrees symmetry with respect to the azimuth angle. We further investigate the influence of the SSD density, the substrate refractive index, and the statistical distributions of the SSD radius and refractive index on the extended BRDF. For transparent substrates, we also find the dependence of the extended BRDF on the SSD positions. (c) 2006 Optical Society of America.