155 resultados para Phosphorus-doped Silicon


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We demonstrate passive Q-switching of short-length double-clad Tm3+-doped silica fiber lasers near 2 mu m pumped by a laser diode array (LDA) at 790 nm. Polycrystalline Cr2+:ZnSe microchips with thickness from 0.3 to 1 mm are adopted as the Q-switching elements. Pulse duration of 120 ns, pulse energy over 14 mu] and repetition rate of 53 kHz are obtained from a 5-cm long fiber laser. As high as 530 kHz repetition rate is achieved from a 50-cm long fiber laser at similar to 10-W pump power. The performance of the Q-switched fiber lasers as a function of fiber length is also analyzed. (c) 2008 Elsevier B.V. All rights reserved.

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A high repetition rate ytterbium-doped double-clad (YDDC) fiber laser with amplifying effect is described by using acousto-optic modulator. The characteristic of Q-switched pulses are studied with accurate control of opening gate time of modulator. The stable Q-switched pulses with tens of nanoseconds width can be observed at high repetition rate varied from 50 kHz to 500 kHz using this laser. The stable operation area of the Q-switched fiber laser is discussed and the analysis results agree well with that of the experiment. (c) 2007 Elsevier B.V. All rights reserved.

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Demonstrations of cw lasing in Cr2+:ZnSe poly-crystal are reported. The laser consists of a 1.7-mm-thick Cr2+:ZnSe poly-crystal disc pumped by a Tm-silica double-clad fibre laser at 2050nm. Using a concave high-reflection mirror with a radius of curvature of 500mm as the rear mirror, the laser delivers up to 1030mW of radiation around 2.367 mu m.

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The effect of laser fluence on the crystallization of amorphous silicon irradiated by a frequency-doubled Nd:YAG laser is studied both theoretically and experimentally. An effective numerical model is set up to predict the melting threshold and the optimized laser fluence for the crystallization of 200-nm-thick amorphous silicon. The variation of the temperature distribution with time and the melt depth is analyzed. Besides the model, the Raman spectra of thin films treated with different fluences are measured to confirm the phase transition and to determine the optimized fluence. The calculating results accord well with those obtained from the experimental data in this research. (C) 2008 Elsevier Ltd. All rights reserved.