An analysis of factors improving technology roadmap credibility: A communications theory assessment of roadmapping processes

In recent years, many industrial firms have been able to use roadmapping as an effective process methodology for projecting future technology and for coordinating technology planning and strategy. Firms potentially realize a number of benefits in deploying technology roadmapping (TRM) processes. Roadmaps provide information identifying which new technologies will meet firms' future product demands, allowing companies to leverage R&D investments through choosing appropriately out of a range of alternative technologies. Moreover, the roadmapping process serves an important communication tool helping to bring about consensus among roadmap developers, as well as between participants brought in during the development process, who may communicate their understanding of shared corporate goals through the roadmap. However, there are few conceptual accounts or case studies have made the argument that roadmapping processes may be used effectively as communication tools. This paper, therefore, seeks to elaborate a theoretical foundation for identifying the factors that must be considered in setting up a roadmap and for analyzing the effect of these factors on technology roadmap credibility as perceived by its users. Based on the survey results of 120 different R&D units, this empirical study found that firms need to explore further how they can enable frequent interactions between the TRM development team and TRM participants. A high level of interaction will improve the credibility of a TRM, with communication channels selected by the organization also positively affecting TRM credibility. © 2011 Elsevier Inc.

Assessment of the contribution of surface roughness to airframe noise

The generation of sound by turbulent boundary-layer flow at low Mach number over a rough wall is investigated by applying a theoretical model that describes the scattering of the turbulence near field into sound by roughness elements. Attention is focused on the numerical method to approximately quantify the absolute level of far-field radiated roughness noise. Models for the source statistics are obtained by scaling smooth-wall data by the increased skin friction velocity and boundary-layer thickness for a rough surface. Numerical integration is performed to determine the roughness noise, and it reproduces the spectral characteristics of the available empirical formula and experimental data. Experiments are conducted to measure the radiated sound from two rough plates in an open jet The measured noise spectra of the rough plates are above that of a smooth plate in 1-2.5 kHz frequency and exhibit reasonable agreement with the predicted level. Estimates of the roughness noise for a Boeing 757 sized aircraft wing with idealized levels of surface roughness show that hi the high-frequency region the sound radiated from surface roughness may exceed that from the trailing edge, and higher overall sound pressure levels are observed for the roughness noise. The trailing edge noise is also enhanced by surface roughness somewhat A parametric study indicates that roughness height and roughness density significantly affect the roughness noise with roughness height having the dominant effect The roughness noise directivity varies with different levels of surface roughness. Copyright © 2007 by the American Institute of Aeronautics and Astronautics, Inc. All rights reserved.

Plasma enhanced chemical vapour deposition carbon nanotubes/nanofibres - How uniform do they grow?

The ability to grow carbon nanotubes/nanofibres (CNs) with a high degree of uniformity is desirable in many applications. In this paper, the structural uniformity of CNs produced by plasma enhanced chemical vapour deposition is evaluated for field emission applications. When single isolated CNs were deposited using this technology, the structures exhibited remarkable uniformity in terms of diameter and height (standard deviations were 4.1 and 6.3% respectively of the average diameter and height). The lithographic conditions to achieve a high yield of single CNs are also discussed. Using the height and diameter uniformity statistics, we show that it is indeed possible to accurately predict the average field enhancement factor and the distribution of enhancement factors of the structures, which was confirmed by electrical emission measurements on individual CNs in an array.