A framework for clarifying the meaning of Triple Bottom-Line, Integrated, and Sustainability Assessment

Terms such as Integrated Assessment and Sustainability Assessment are used to label 'new' approaches to impact assessment that are designed to direct planning and decision-making towards sustainable development (SD). Established assessment techniques, such as EIA and SEA, are also widely promoted as SD 'tools'. This paper presents the findings of a literature review undertaken to identify the features that are typically promoted for improving the SD-directedness of assessments. A framework is developed which reconciles the broad range of emerging approaches and tackles the inconsistent use of terminology. The framework comprises a three-dimensional space defined by the following axes: the comprehensiveness of the SD coverage; the degree of 'integration' of the techniques and themes; and the extent to which a strategic perspective is adopted. By applying the framework, assessment approaches can be positioned relative to one another, enabling comparison on the basis of substance rather than semantics. © 2007 Elsevier Inc. All rights reserved.

Interpretation of measured profile losses in unsteady wake-turbine blade interaction studies

The interaction of wakes shed by a moving bladerow with a downstream bladerow causes unsteady flow. The meaning of the freestream stagnation pressure and stagnation enthalpy in these circumstances has been examined using simple analyses, measurements and CFD. The unsteady flow in question arises from the behaviour of the wakes as so-called negative-jets. The interactions of the negative-jets with the downstream blades lead to fluctuations in static pressure which in turn generate fluctuations in the stagnation pressure and stagnation enthalpy. It is shown that the fluctuations of the stagnation quantities created by unsteady effects within the bladerow are far greater than those within the incoming wake. The time-mean exit profiles of the stagnation pressure and stagnation enthalpy are affected by these large fluctuations. This phenomenon of energy separation is much more significant than the distortion of the time-mean exit profiles that is caused directly by the cross-passage transport associated with the negative-jet, as described by Kerrebrock and Mikolajczak. Finally, it is shown that if only time-averaged values of loss are required across a bladerow, it is nevertheless sufficient to determine the time-mean exit stagnation pressure.

Electrostatic force microscopy and potentiometry of realistic nanostructured systems

We investigate the dependency of electrostatic interaction forces on applied potentials in electrostatic force microscopy (EFM) as well as in related local potentiometry techniques such as Kelvin probe microscopy (KPM). The approximated expression of electrostatic interaction between two conductors, usually employed in EFM and KPM, may loose its validity when probe-sample distance is not very small, as often realized when realistic nanostructured systems with complex topography are investigated. In such conditions, electrostatic interaction does not depend solely on the potential difference between probe and sample, but instead it may depend on the bias applied to each conductor. For instance, electrostatic force can change from repulsive to attractive for certain ranges of applied potentials and probe-sample distances, and this fact cannot be accounted for by approximated models. We propose a general capacitance model, even applicable to more than two conductors, considering values of potentials applied to each of the conductors to determine the resulting forces and force gradients, being able to account for the above phenomenon as well as to describe interactions at larger distances. Results from numerical simulations and experiments on metal stripe electrodes and semiconductor nanowires supporting such scenario in typical regimes of EFM investigations are presented, evidencing the importance of a more rigorous modeling for EFM data interpretation. Furthermore, physical meaning of Kelvin potential as used in KPM applications can also be clarified by means of the reported formalism. © 2009 American Institute of Physics.