3 resultados para depth profiling

em Cambridge University Engineering Department Publications Database


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In this paper we demonstrate how secondary ion mass spectrometry (SIMS) can be applied to ZnO nanowire structures for gold catalyst residue determination. Gold plays a significant role in determining the structural properties of such nanowires, with the location of the gold after growth being a strong indicator of the growth mechanism. For the material investigated here, we find that the gold remains at the substrate-nanowire interface. This was not anticipated as the usual growth mechanism associated with catalyst growth is of a vapour-liquid-solid (VLS) type. The results presented here favour a vapour-solid (VS) growth mechanism instead. Copyright © 2007 John Wiley & Sons, Ltd.

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The geological profile of submerged slopes on the continental shelf typically includes soft cohesive soils with thicknesses ranging from a few meters to tens or hundreds of meters. The response of these soils in simple shear tests is largely influenced by the presence of an initial consolidation shear stress, inducing anisotropic stress-strain-strength properties which depend also on the direction of shear. In this paper, a new simplified effective-stress-based model describing the behavior of normally to lightly overconsolidated cohesive soils is used in conjunction with a one-dimensional seismic site response analysis computer code to illustrate the importance of accounting for anisotropy and small strain nonlinearity. In particular, a simple example is carried out to compare results for different slope inclinations. Depth profiling of the maximum shear strains and permanent deformations provide insight into the mechanisms of deformation during a seismic event, and the effects of sloping ground conditions.