Three-Dimensional Tracking of Construction Resources using an On-Site Camera System

Vision trackers have been proposed as a promising alternative for tracking at large-scale, congested construction sites. They provide the location of a large number of entities in a camera view across frames. However, vision trackers provide only two-dimensional (2D) pixel coordinates, which are not adequate for construction applications. This paper proposes and validates a method that overcomes this limitation by employing stereo cameras and converting 2D pixel coordinates to three-dimensional (3D) metric coordinates. The proposed method consists of four steps: camera calibration, camera pose estimation, 2D tracking, and triangulation. Given that the method employs fixed, calibrated stereo cameras with a long baseline, appropriate algorithms are selected for each step. Once the first two steps reveal camera system parameters, the third step determines 2D pixel coordinates of entities in subsequent frames. The 2D coordinates are triangulated on the basis of the camera system parameters to obtain 3D coordinates. The methodology presented in this paper has been implemented and tested with data collected from a construction site. The results demonstrate the suitability of this method for on-site tracking purposes.

Microstructural evolution of SiOx films and its effect on the luminescence of Si nanoclusters

In this paper we demonstrate that the structural and optical properties of Si nanoclusters (Si ncs) formed by thermal annealing of SiOx films prepared by plasma enhanced chemical vapor deposition (PECVD) and magnetron sputtering are very different. In fact, at a fixed Si excess and annealing temperature, photoluminescence (PL) spectra of sputtered samples are redshifted with respect to PECVD samples, denoting a larger Si ncs size. In addition, PL intensity reaches a maximum in sputtered films at annealing temperatures much lower than those needed in PECVD films. These data are correlated with structural properties obtained by energy filtered transmission electron microscopy and electron energy loss spectroscopy. It is shown that in PECVD films only around 30% of the Si excess agglomerates in clusters while an almost complete agglomeration occurs in sputtered films. These data are explained on the basis of the different initial structural properties of the as-deposited films that become crucial for the subsequent evolution. © 2008 American Institute of Physics.

Nanoscale mode selector in silicon waveguide for on chip nanofocusing applications.

We demonstrate a nanoscale mode selector supporting the propagation of the first antisymmetric mode of a silicon waveguide. The mode selector is based on embedding a short section of PhC into the waveguide. On the basis of the difference in k-vector distribution between orthogonal waveguide modes, the PhC can be designed to have a band gap for the fundamental mode, while allowing the transmission of the first antisymmetric mode. The device was tested by directly measuring the modal content before and after the PhC section using a near field scanning optical microscope. Extinction ratio was estimated to be approximately 23 dB. Finally, we provide numerical simulations demonstrating strong coupling of the antisymmetric mode to metallic nanotips. On the basis of the results, we believe that the mode selector may become an important building block in the realization of on chip nanofocusing devices.