Restoration of images and 3D data to higher resolution by deconvolution with sparsity regularization

Image convolution is conventionally approximated by the LTI discrete model. It is well recognized that the higher the sampling rate, the better is the approximation. However sometimes images or 3D data are only available at a lower sampling rate due to physical constraints of the imaging system. In this paper, we model the under-sampled observation as the result of combining convolution and subsampling. Because the wavelet coefficients of piecewise smooth images tend to be sparse and well modelled by tree-like structures, we propose the L0 reweighted-L2 minimization (L0RL2 ) algorithm to solve this problem. This promotes model-based sparsity by minimizing the reweighted L2 norm, which approximates the L0 norm, and by enforcing a tree model over the weights. We test the algorithm on 3 examples: a simple ring, the cameraman image and a 3D microscope dataset; and show that good results can be obtained. © 2010 IEEE.

The practical feasibility of using RFID in a metal environment

Passive Radio Frequency Identification (RFID) has revolutionized the way in which products are identified. This paper considers the effect of metals on the performance of RFID at ultra high frequency (UHF). The paper establishes read patterns in space, highlighting the interference of RF waves due to three different metals, one ferrous and the other two non ferrous, when placed behind a transponder. The effect of thickness of the metal plate is also examined. Different metals have been found to have different interference effects although there are some similarities in their read patterns related to their material properties. Also experiments have been carried out to identify and establish various methods of improving this performance. Finally, differences between performance-measuring parameters, namely attenuating transmitted power and calculating read rate at a fixed attenuation are established and possible reasons of these observations are presented. © 2007 IEEE.