10 resultados para Time-of-Flight

em Cambridge University Engineering Department Publications Database


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Image-based (i.e., photo/videogrammetry) and time-of-flight-based (i.e., laser scanning) technologies are typically used to collect spatial data of infrastructure. In order to help architecture, engineering, and construction (AEC) industries make cost-effective decisions in selecting between these two technologies with respect to their settings, this paper makes an attempt to measure the accuracy, quality, time efficiency, and cost of applying image-based and time-of-flight-based technologies to conduct as-built 3D reconstruction of infrastructure. In this paper, a novel comparison method is proposed, and preliminary experiments are conducted. The results reveal that if the accuracy and quality level desired for a particular application is not high (i.e., error < 10 cm, and completeness rate > 80%), image-based technologies constitute a good alternative for time-of-flight-based technologies and significantly reduce the time and cost needed for collecting the data on site.

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Image-based (i.e., photo/videogrammetry) and time-of-flight-based (i.e., laser scanning) technologies are typically used to collect spatial data of infrastructure. In order to help architecture, engineering, and construction (AEC) industries make cost-effective decisions in selecting between these two technologies with respect to their settings, this paper makes an attempt to measure the accuracy, quality, time efficiency, and cost of applying image-based and time-of-flight-based technologies to conduct as-built 3D reconstruction of infrastructure. In this paper, a novel comparison method is proposed, and preliminary experiments are conducted. The results reveal that if the accuracy and quality level desired for a particular application is not high (i.e., error < 10 cm, and completeness rate > 80%), image-based technologies constitute a good alternative for time-of-flight-based technologies and significantly reduce the time and cost needed for collecting the data on site.

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We have investigated a resonant refractive nonlinearity in a semiconductor waveguide by measuring intensity dependent phase shifts and bias-dependent recovery times. The measurements were performed on an optimized 750-μm-long AR coated buried heterostructure MQW p-i-n waveguide with a bandedge at 1.48 μm. Figure 1 shows the experimental arrangement. The mode-locked color center laser was tuned to 50 meV beyond the bandedge and 8 ps pulses with peak incident power up to 57 W were coupled into the waveguide. Some residual bandtail absorption remains at this wavelength and this is sufficient to cause carriers to be photogenerated and these give rise to a refractive nonlinearity, predominantly by plasma and bandfilling effects. A Fabry-Perot interferometer is used to measure the spectrum of the light which exits the waveguide. The nonlinearity within the guide causes self phase modulation (SPM) of the light and a study of the spectrum allows information to be recovered on the magnitude and recovery time of the nonlinear phase shift with a reasonable degree of accuracy. SPM spectra were recorded for a variety of pulse energies coupled into he unbiased waveguide. Figure 2 shows the resultant phase shift measured from the SPM spectra as a function of pulse energy. The relationship is a linear one, indicating that no saturation of the nonlinearity occurs for coupled pulse energies up to 230 pJ. A π phase shift, the minimum necessary for an all-optical switch, is obtained for a coupled pulse energy of 57 pJ while the maximum phase shift, 4 π, was measured for 230 pJ. The SPM spectra were highly asymmetric with pulse energy shifted to higher frequencies. Such spectra are characteristic of a slow, negative nonlinearity. This relatively slow speed is expected for the unbiased guide as the recovery time will be of the order of the recombination time of the photogenerated electrons, about 1 ns for InGaAsP material. In order to reduce the recovery time of the nonlinearity, it is necessary to remove the photogenerated carriers from the waveguide by a process other than recombination. One such technique is to apply a reverse bias to the waveguide in order to sweep the carriers out. Figure 3 shows the effect on the recovery time of the nonlinearity of applying reverse bias to the waveguide for 230 pJ coupled power. The recovery time was reduced from one much longer than the length of the pulse, estimated to be about 1 ns, at zero bias to 18 ± 3 ps for a bias voltage greater than -4 V. This compares with a value of 24 ps obtained in a bulk waveguide.

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A number of methods are commonly used today to collect infrastructure's spatial data (time-of-flight, visual triangulation, etc.). However, current practice lacks a solution that is accurate, automatic, and cost-efficient at the same time. This paper presents a videogrammetric framework for acquiring spatial data of infrastructure which holds the promise to address this limitation. It uses a calibrated set of low-cost high resolution video cameras that is progressively traversed around the scene and aims to produce a dense 3D point cloud which is updated in each frame. It allows for progressive reconstruction as opposed to point-and-shoot followed by point cloud stitching. The feasibility of the framework is studied in this paper. Required steps through this process are presented and the unique challenges of each step are identified. Results specific to each step are also presented.

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Infrastructure spatial data, such as the orientation and the location of in place structures and these structures' boundaries and areas, play a very important role for many civil infrastructure development and rehabilitation applications, such as defect detection, site planning, on-site safety assistance and others. In order to acquire these data, a number of modern optical-based spatial data acquisition techniques can be used. These techniques are based on stereo vision, optics, time of flight, etc., and have distinct characteristics, benefits and limitations. The main purpose of this paper is to compare these infrastructure optical-based spatial data acquisition techniques based on civil infrastructure application requirements. In order to achieve this goal, the benefits and limitations of these techniques were identified. Subsequently, these techniques were compared according to applications' requirements, such as spatial accuracy, the automation of acquisition, the portability of devices and others. With the help of this comparison, unique characteristics of these techniques were identified so that practitioners will be able to select an appropriate technique for their own applications.

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Infrastructure spatial data, such as the orientation and the location of in place structures and these structures' boundaries and areas, play a very important role for many civil infrastructure development and rehabilitation applications, such as defect detection, site planning, on-site safety assistance and others. In order to acquire these data, a number of modern optical-based spatial data acquisition techniques can be used. These techniques are based on stereo vision, optics, time of flight, etc., and have distinct characteristics, benefits and limitations. The main purpose of this paper is to compare these infrastructure optical-based spatial data acquisition techniques based on civil infrastructure application requirements. In order to achieve this goal, the benefits and limitations of these techniques were identified. Subsequently, these techniques were compared according to applications' requirements, such as spatial accuracy, the automation of acquisition, the portability of devices and others. With the help of this comparison, unique characteristics of these techniques were identified so that practitioners will be able to select an appropriate technique for their own applications.

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In this study, TiN/La 2O 3/HfSiON/SiO 2/Si gate stacks with thick high-k (HK) and thick pedestal oxide were used. Samples were annealed at different temperatures and times in order to characterize in detail the interaction mechanisms between La and the gate stack layers. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) measurements performed on these samples show a time diffusion saturation of La in the high-k insulator, indicating an La front immobilization due to LaSiO formation at the high-k/interfacial layer. Based on the SIMS data, a technology computer aided design (TCAD) diffusion model including La time diffusion saturation effect was developed. © 2012 American Institute of Physics.