Modelling the entrainment and motion of particles in a gap: Application to abrasive wear

The microscale abrasion or ball-cratering test is being increasingly applied to a wide range of bulk materials and coatings. The response of materials to this test depends critically on the nature of the motion of the abrasive particles in the contact zone: whether they roll and produce multiple indentations in the coating, or slide causing grooving abrasion. Similar phenomena also occur when hard contaminant particles enter a lubricated contact. This paper presents simple quantitative two-dimensional models which describe two aspects of the interaction between a hard abrasive particle and two sliding surfaces. The first model treats the conditions under which a spherical abrasive particle of size d can be entrained into the gap between a rotating sphere of radius R and a plane surface. These conditions are determined by the coefficients of friction between the particle and the sphere, and the particle and the plane, denoted by μs and μp respectively. This model predicts that the values of (μs + μp) and 2μs should both exceed √2d/R for the particles to be entrained into the contact. If either is less than this value, the particle will slide against the sphere and never enter the contact. The second model describes the mechanisms of abrasive wear in a contact when an idealized rhombus-sectioned prismatic particle is located between two parallel plane surfaces separated by a certain distance, which can represent either the thickness of a fluid film or the spacing due to the presence of other particles. It is shown that both the ratio of particle size to the separation of the surfaces and the ratio of the hardnesses of the two surfaces have important influences on the particle motion and hence on the mechanism of the resulting abrasive wear. Results from this model are compared with experimental observations, and the model is shown to lead to realistic predictions. © IMechE 2003.

Friction of sliding surfaces carrying adsorbed lubricant layers

In concentrated contacts the behaviour of lubricants is much modified by the high local pressures: changes can arise both from molecular ordering within the very thin film lubricant layers present at the interface as well as from the deposition on the component surfaces of more solid-like polymeric boundary layers. These 'third bodies' separating the solid surfaces may have rheological or mechanical properties very different from those observed in the bulk. Classical elasto-hydrodynamic theory considers the entrapped lubricant to exhibit a piezo-viscous behaviour while the conventional picture of more solid boundary lubricant layers views their shear strength r as being linearly dependent on local pressure p, so that T = TO + ap where TO and a are constants. If TO is relatively small, then the coefficient of friction \i = T Ip ~ a and so Amonton's laws are recovered. However, the properties of adsorbed or deposited surface films, or indeed other third bodies such as debris layers, may be more complex than this. A preliminary study has looked quantitatively at the influence of the pressure dependence of the shear strength of any surface layer on the overall friction coefficient of a contact which is made up of an array of asperities whose height varies in a Gaussian manner. Individual contact points may be elastic or plastic. The analysis results in plots of coefficient of friction versus the service or load parameter PIH&NRa where P is the nominal pressure on the contact, HS the hardness of the deforming surface, N the asperity density, R the mean radius of curvature of the asperities, and a is the standard deviation of their height distribution. In principle, any variation oft withp can be incorporated into the model; however, in this initial study we have used data on colloidal suspensions from the group at the Ecole Centrale de Lyon as well as examining the effect of functional relationships of somewhat greater complexity than a simple linear form. Results of the analysis indicate that variations in fj. are possible as the load is varied which depend on the statistical spread of behaviour at individual asperity contacts. The value of this analysis is that it attempts to combine the behaviour of films on the molecular scale with the topography of real engineering surfaces and so give an indication of the effects at the full-size or macro-scale that can be achieved by chemical or molecular surface engineering.

Pulsed-field magnetization of drilled bulk high-temperature superconductors: flux front propagation in the volume and on the surface

We present a method for characterizing the propagation of the magnetic flux in an artificially drilled bulk high-temperature superconductor (HTS) during a pulsed-field magnetization. As the magnetic pulse penetrates the cylindrical sample, the magnetic flux density is measured simultaneously in 16 holes by means of microcoils that are placed across the median plane, i.e. at an equal distance from the top and bottom surfaces, and close to the surface of the sample. We discuss the time evolution of the magnetic flux density in the holes during a pulse and measure the time taken by the external magnetic flux to reach each hole. Our data show that the flux front moves faster in the median plane than on the surface when penetrating the sample edge; it then proceeds faster along the surface than in the bulk as it penetrates the sample further. Once the pulse is over, the trapped flux density inside the central hole is found to be about twice as large in the median plane than on the surface. This ratio is confirmed by modelling.

Ni(Pt)-silicide contacts on CMOS devices: Impact of substrate nature and Pt concentration on the phase formation

Ni silicides used as contacts in source/drain and gate of advanced CMOS devices were analyzed by atom probe tomography (APT) at atomic scale. These measurements were performed on 45 nm nMOS after standard self-aligned silicide (salicide) process using Ni(5 at.% Pt) alloy. After the first annealing (RTA1), δ-Ni2Si was the only phase formed on gate and source/drain while, after the second annealing (RTA2), two different Ni silicides have been formed: NiSi on the gate and δ-Ni2Si on the source and drain. This difference between source/drain and gate regions in nMOS devices has been related to the Si substrate nature (poly or mono-crystalline) and to the size of the contact. In fact, NiSi seems to have difficulties to nucleate in the narrow source/drain contact on mono-crystalline Si. The results have been compared to analysis performed on 28 nm nMOS where the Pt concentration is higher (10 at.% Pt). In this case, θ-Ni2Si is the first phase to form after RTA1 and NiSi is then formed at the same time on source (or drain) and gate after RTA2. The absence of the formation of NiSi from δ-Ni 2Si/Si(1 0 0) interface compared to θ-Ni2Si/Si(1 0 0) interface could be related to the difference of the interface energies. The redistributions of As and Pt in different silicides and interfaces were measured and discussed. In particular, it has been evidenced that Pt redistributions obtained on both 45 and 28 nm MOS transistors correspond to respective Pt distributions measured on blanket wafers. © 2013 Elsevier B.V. All rights reserved.

Links between energy dissipation and wear mechanisms in solid epoxy/epoxy sliding contact

This paper covers wear and energy dissipation of solid epoxy induced by the alternative rubbing between two samples of identical thermosetting polymer. Varying normal load, sliding velocity and sliding distance, the authors were able to define and discuss wear and friction laws and associated energy dissipation. Moreover, traces of several wear mechanisms were distinguished on the worn surfaces and associated with applied conditions. Observed under higher velocity, polymer softening and local state transition were explained by surface temperature estimate and confirmed by infra-red spectroscopy measurements. To conclude this study, all observed phenomena are classified into two wear scenarios according to sliding velocity. © 2014 Elsevier Ltd.

High resolution cortical bone thickness measurement from clinical CT data.

The distribution of cortical bone in the proximal femur is believed to be a critical component in determining fracture resistance. Current CT technology is limited in its ability to measure cortical thickness, especially in the sub-millimetre range which lies within the point spread function of today's clinical scanners. In this paper, we present a novel technique that is capable of producing unbiased thickness estimates down to 0.3mm. The technique relies on a mathematical model of the anatomy and the imaging system, which is fitted to the data at a large number of sites around the proximal femur, producing around 17,000 independent thickness estimates per specimen. In a series of experiments on 16 cadaveric femurs, estimation errors were measured as -0.01+/-0.58mm (mean+/-1std.dev.) for cortical thicknesses in the range 0.3-4mm. This compares with 0.25+/-0.69mm for simple thresholding and 0.90+/-0.92mm for a variant of the 50% relative threshold method. In the clinically relevant sub-millimetre range, thresholding increasingly fails to detect the cortex at all, whereas the new technique continues to perform well. The many cortical thickness estimates can be displayed as a colour map painted onto the femoral surface. Computation of the surfaces and colour maps is largely automatic, requiring around 15min on a modest laptop computer.

Development of a classical force field for the oxidized Si surface: application to hydrophilic wafer bonding.

We have developed a classical two- and three-body interaction potential to simulate the hydroxylated, natively oxidized Si surface in contact with water solutions, based on the combination and extension of the Stillinger-Weber potential and of a potential originally developed to simulate SiO(2) polymorphs. The potential parameters are chosen to reproduce the structure, charge distribution, tensile surface stress, and interactions with single water molecules of a natively oxidized Si surface model previously obtained by means of accurate density functional theory simulations. We have applied the potential to the case of hydrophilic silicon wafer bonding at room temperature, revealing maximum room temperature work of adhesion values for natively oxidized and amorphous silica surfaces of 97 and 90 mJm(2), respectively, at a water adsorption coverage of approximately 1 ML. The difference arises from the stronger interaction of the natively oxidized surface with liquid water, resulting in a higher heat of immersion (203 vs 166 mJm(2)), and may be explained in terms of the more pronounced water structuring close to the surface in alternating layers of larger and smaller densities with respect to the liquid bulk. The computed force-displacement bonding curves may be a useful input for cohesive zone models where both the topographic details of the surfaces and the dependence of the attractive force on the initial surface separation and wetting can be taken into account.