Designing MPC controllers by reverse-engineering existing LTI controllers

This technical report presents a method for designing a constrained output-feedback model predictive controller (MPC) that behaves in the same way as an existing baseline stabilising linear time invariant output-feedback controller when constraints are inactive. The baseline controller is cast into an observer-compensator form and an inverse-optimal cost function is used as the basis of the MPC controller. The available degrees of design freedom are explored, and some guidelines provided for the selection of an appropriate observer-compensator realisation that will best allow exploitation of the constraint-handling and redundancy management capabilities of MPC. Consideration is given to output setpoint tracking, and the method is demonstrated with three different multivariable plants of varying complexity.

Designing output-feedback predictive controllers by reverse-engineering existing LTI controllers

An approach to designing a constrained output-feedback predictive controller that has the same small-signal properties as a pre-existing output-feedback linear time invariant controller is proposed. Systematic guidelines are proposed to select an appropriate (non-unique) realization of the resulting state observer. A method is proposed to transform a class of offset-free reference tracking controllers into the combination of an observer, steady-state target calculator and predictive controller. The procedure is demonstrated with a numerical example. © 2013 IEEE.

Local lifetime engineering in 600V pin diode using mix-mode simulation

This paper reports a detailed analysis of the effect of local lifetime killing (LLK) within the drift region on the reverse recovery (RR) characteristics and on-state performance of 600V Silicon PiN diodes. The paper also discusses the influence of the measurement circuit on the reverse recovery of the high voltage diodes and it proposes a simple and effective mix-mode simulation tool for an accurate assessment of the diode performance in reverse recovery mode. © 2013 IEEE.