2 resultados para Expanded critical incident technique

em Cambridge University Engineering Department Publications Database


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Thin films of nano-composite Y-Ba-Cu-O (YBCO) superconductors containing nano-sized, non-superconducting particles of Y2Ba 4CuMOx (M-2411 with M = Ag and Nb) have been prepared by the PLD technique. Electron backscatter diffraction (EBSD) has been used to analyze the crystallographic orientation of nano-particles embedded in the film microstructure. The superconducting YBa2Cu3O7 (Y-123) phase matrix is textured with a dominant (001) orientation for all samples, whereas the M-2411 phase exhibits a random orientation. Angular critical current measurements at various temperature (T) and applied magnetic field (B) have been performed on thin films containing different concentration of the M-2411 second phase. An increase in critical current density J c at T < 77 K and B < 6 T is observed for samples with low concentration of the second phase (2 mol % M-2411). Films containing 5 mol % Ag-2411 exhibit lower Jc than pure Y-123 thin films at all fields and temperatures. Samples with 5 mol % Nb-2411 show higher Jc(B) than phase pure Y-123 thin films for T < 77 K. © 2010 IOP Publishing Ltd.

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Application of High Temperature Superconducting (HTS) has been increasingly popular since the new superconducting materials were discovered. This paper presents a new high-precision digital lock-in measurement technique which is used for measuring critical current and AC loss of the 2nd Generation HTS tape. Using a lock-in amplifier and nano-voltage meter, we can resolve signals at nano-volt level, while using a specially designed compensation coil we can cancel out inductive by adjusting the coil inductance. Furthermore, a finer correction for the inductive component can be achieved by adjusting the reference phase of the lock-in amplifier. The critical current and AC loss measurement algorithms and hardware layout are described and analyzed, and results for both numerical and experimental data under varieties of frequencies are presented. © 2008 SICE.