Thickness of the near-interface regions and central bulk ohmic resistivity in lead lanthanum zirconate titanate ferroelectric thin films

Thickness of the near-interface regions (NIR) and central bulk ohmic resistivity in lead lanthanum zirconate titanate ferroelectric thin films were investigated. A method to separate the low-resistive near-interface regions (NIRs) from the high-resistive central bulk region (CBR) in ferroelectric thin films was presented. Results showed that the thickness of the NIRs depended on the electrode materials in use and the CBR resistivity depended on the impurity doping levels.

Pulsed-field magnetization of drilled bulk high-temperature superconductors: flux front propagation in the volume and on the surface

We present a method for characterizing the propagation of the magnetic flux in an artificially drilled bulk high-temperature superconductor (HTS) during a pulsed-field magnetization. As the magnetic pulse penetrates the cylindrical sample, the magnetic flux density is measured simultaneously in 16 holes by means of microcoils that are placed across the median plane, i.e. at an equal distance from the top and bottom surfaces, and close to the surface of the sample. We discuss the time evolution of the magnetic flux density in the holes during a pulse and measure the time taken by the external magnetic flux to reach each hole. Our data show that the flux front moves faster in the median plane than on the surface when penetrating the sample edge; it then proceeds faster along the surface than in the bulk as it penetrates the sample further. Once the pulse is over, the trapped flux density inside the central hole is found to be about twice as large in the median plane than on the surface. This ratio is confirmed by modelling.