Electronic load interface for improving PV dual-converter system operational margin

An electronic load interface (ELI) for improving the operational margin of a photovoltaic (PV) dual-converter system under dynamic conditions is presented. The ELI - based on a modified buck-boost converter - interfaces the output of the converters and the load system. It improves the operational margin of the PV dual-converter system by extending the conditions under which the dual-converter system operates at the maximum power point. The ELI is activated as and when needed, so as minimise system losses. By employing the ELI, utilisation and efficiency of a PV dual-converter system increases. In general, the concept of the ELI can be applied to multi-converter PV systems - such as multi-converter inverters, and multi-converter DC-DC converter systems - for performance and efficiency improvement. © 2013 The Institution of Engineering and Technology.

On-line topographic analysis in the SEM

A novel method for on-line topographic analysis of rough surfaces in the SEM has been investigated. It utilises a digital minicomputer configured to act as a programmable scan generator and automatic focusing unit. The computer is coupled to the microscope through digital-to-analogue converters which enable it to generate ramp waveforms allowing the beam to be scanned over a small sub-region of the field under program control. A further digital-to-analogue converter regulates the current supply to the objective lens of the microscope. The video signal is sampled by means of an analogue-to-digital converter and the resultant binary code stored in the computer's memory as an array of numbers describing relative image intensity. Computations based on the intensity gradient of the image allow the objective lens current to be found for the in-focus condition, which may be related to the working distance through a previous calibration experiment. The sensitivity of the method for detecting small height changes is theoretically of the order of 1 μm. In practice the operator specifies features of interest by means of a mobile spot cursor injected into the SEM display screen, or he may scan the specimen at sub-regions corresponding to pre-determined points on a regular grid defined by him. The operation then proceeds under program control. | A novel method for on-line topographic analysis of rough surfaces in the SEM has been investigated. It utilizes a digital minicomputer configured to act as a programmable scan generator and automatic focusing unit. A further digital-to-analog converter regulates the current supply to the objective lens of the microscope. The video signal is sampled by means of an analog-to-digital converter and the resultant binary code stored in the computer's memory as an array of numbers describing relative image intensity. The sensitivity of the method for detecting small height changes is theroretically of the order of 1 mu m.

Topographical analysis in the SEM using an automatic focusing technique

A novel technique for automated topographical analysis in the SEM has been investigated. It utilizes a 16-bit minicomputer arranged to act as an automatic focusing unit. The computer is coupled to the objective lens of the microscope, by means of a digital to analogue converter, and may regulate the excitation of the lens under program control. Further digital-to-analogue converters allow the computer to act as a programmable scan generator by applying ramp waveforms to the scan amplifiers, permitting the beam to be swept over a small sub-region of the field of interest. The video signal is sampled and applied to an analogue-to-digital converter; the resultant binary numbers are stored in computer memory as an array of values representing relative image intensities within a subregion. A differencing algorithm applied to the collected data allows the level of objective lens excitation to be found at which the sharpness of the image is optimized, and the excitation may be related to the working distance for that subregion through a previous calibration experiment. The sensitivity of the method for detecting small height changes is theoretically of the order of 1 μm.

Numerical analysis of AC loss reduction in HTS superconducting coils using magnetic materials to divert flux

In this paper, the use of magnetic materials to divert flux in high-temperature superconductor superconducting coils and reduce transport ac loss is investigated. This particular technique is preferred over other techniques, such as striation, Roebel transposition, and twisted wires because it does not require modification to the conductor itself, which can be detrimental to the properties of the superconductor. The technique can also be implemented for existing coils. The analysis is carried out using a coil model based on the H formulation and implemented in comsol multiphysics. Both weakly and strongly magnetic materials are investigated, and it is shown that the use of such materials can divert flux and achieve a reduction in transport ac loss, which, in some cases, is quite significant. This analysis acts to provide a foundation for further optimization and experimental work in the future. © 2011 IEEE.

The experiment to evaluate the AC loss of 2G HTS windings in the application of rotating electric machines

This paper presents the design of an AC loss experiment using nitrogen boil-off method. This experiment is aimed at exploring the AC loss of HTS double race-track coils which will be installed on the rotor of a wind turbine generator. The operating environment is simulated by designing a cryostat with rotating magnetic field windings. Apart from the fact that the alternating magnetic field causes most of AC loss on the HTS coils, we also believe that the DC background field would be another important factor causing AC loss if the HTS coil is experiencing by both alternating magnetic field in the perpendicular direction and DC background field in the parallel direction. In order to perform the boil-off measurement, we present the method to estimate the heat leakage in the cryostat which might cause errors to the measurement. © 2011 IEEE.