15 resultados para 760201 Institutional arrangements
em Cambridge University Engineering Department Publications Database
Resumo:
Simulation studies were conducted on the magnetization of (RE)BCO (RE-Ba-Cu-O, where RE represents a rare earth element) bulk superconductors using various split-coil arrangements by solving the critical state equation using the commercial software FlexPDE. A pair of coaxial coils of identical size is identified as an optimum arrangement for practical magnetization at 77K by the zero-field cooling technique. In general, the magnetization process is likely to be most effective when the outer radius of the coils lies between 100% and 50% of the sample radius. A relatively large coil pair is necessary for samples with either a smaller aspect ratio or larger values of J c0. Two different regimes of flux penetration are found to be involved in the magnetization process. For a sufficiently small sample, the penetration field is determined by flux propagation from beneath the coil to the centre of the sample; for a sufficiently large sample, the definitive propagation route is from beneath the coil to the periphery of the sample. Effective split-coil magnetization occurs only in the former regime, and both penetration regimes are completely different from that involved in the solenoidal-coil magnetization process. © 2012 IOP Publishing Ltd.
Resumo:
The structure, formation energy, and energy levels of the various oxygen vacancies in Ta2O5 have been calculated using the λ phase model. The intra-layer vacancies give rise to unusual, long-range bonding rearrangements, which are different for each defect charge state. The 2-fold coordinated intra-layer vacancy is the lowest cost vacancy and forms a deep level 1.5 eV below the conduction band edge. The 3-fold intra-layer vacancy and the 2-fold inter-layer vacancy are higher cost defects, and form shallower levels. The unusual bonding rearrangements lead to low oxygen migration barriers, which are useful for resistive random access memory applications. © 2014 AIP Publishing LLC.