173 resultados para polarization microscopy

Electronic properties of tetrahedral amorphous carbon investigated by scanning tunneling microscopy

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Electronic and topographic structure of ta-C, ta-C:N and ta-C:B investigated by scanning tunnelling microscopy

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Electronic properties of tetrahedral amorphous carbon investigated by scanning tunneling microscopy

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In-situ scanning tunnelling microscopy of hydrogenated amorphous silicon and microcrystalline silicon

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Potentiometry and repair of electrically stressed nanowires using atomic force microscopy

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Photon emission from Si(111)-(7 x 7) induced by scanning tunneling microscopy: atomic scale and material contrast

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Characterization of tips for conducting atomic force microscopy in ultrahigh vacuum

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Atomic force microscopy at solid-liquid interfaces

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Simultaneous force and conduction measurements in atomic force microscopy

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Remote microscopy in the real world

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In-situ scanning tunnelling microscopy of hydrogenated amorphous silicon and microcrystalline silicon

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FIRST A.I.D.: using remote microscopy and artificial intelligence for SEM fault diagnosis

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Lateral stiffness of the tip and tip-sample contact in frictional force microscopy

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A transmission electron microscopy study of the crystallinity and secondary phase formation in melt processed YBa2Cu3O7-δ

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High-temperature scanning tunneling microscopy study of the Li/Si(111) surface

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