Biblioteca Digital

132 resultados para Cryoelectron Microscopy

Study of shear force as a distance regulation mechanism for scanning near-field optical microscopy

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Atomic force microscopy stress sensors for studies in liquids

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A normal force distance regulation scheme for near-field optical microscopy

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Conducting atomic force microscopy study of silicon dioxide breakdown

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Observation of the ordered growth of coronene on Ag(111): a scanning tunnelling microscopy study of vacuum deposited molecules

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Characterization of tips for conducting atomic force microscopy

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Charging effects observed by low-temperature scanning tunnelling microscopy of gold islands

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An in-situ high temperature scanning tunnelling microscopy study of the boron-induced reconstruction on the Si(111) surface

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Magnetic force microscopy of Co-Pd multilayers with perpendicular anisotropy

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Force microscopy imaging in liquids using ac techniques

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Atomic force microscopy of local compliance at solid-liquid interfaces

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Photon-emission scanning tunneling microscopy of silver films in ultrahigh vacuum: A spectroscopic method

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Tip effects and surface modification in scanning tunnelling microscopy

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Spatially resolved electrical measurements of SiO2 gate oxides using atomic force microscopy

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Characterisation of electronic and structural properties of thin silicon dioxide films by scanned probe microscopy

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