Biblioteca Digital

88 resultados para POTASSIUM-ION

Focused ion beams and silicon-on-insulator - a novel approach to MEMS

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Focused ion beams for microfabrication

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Micromachining and focused ion beam etching of Si for accelerometers

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A microaccelerometer structure with "tapping-mode" readout - fabriction in silicon-on-insulator using a focused ion beam process

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Focused ion beams for microfabrication

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Focused ion beams for microfabrication

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Focused ion beams in microsystem fabrication

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Nano and micro technology applications of focused ion beam processing

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The advantages of normal incidence ultra-low energy secondary ion mass spectrometry depth profiling

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Ultralow energy secondary ion mass spectrometry and transient yields at the silicon surface

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Quantification of secondary-ion-mass spectroscopy depth profiles using maximum entropy deconvolution with a sample independent response function

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THEORY OF THE SINGLE ION MAGNETOCRYSTALLINE ANISOTROPY OF 3D IONS

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THE INFLUENCE OF ODD PARITY CRYSTAL-FIELD ON LEVEL SPLITTING OF CE-3+ ION

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Characterization of the noise in secondary ion mass spectrometry depth profiles

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Design, Development and Operation of Novel Ion Trap Geometries

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