High resolution direct measurement of temperature distribution in silicon nanophotonics devices.

Following the miniaturization of photonic devices and the increase in data rates, the issues of self heating and heat removal in active nanophotonic devices should be considered and studied in more details. In this paper we use the approach of Scanning Thermal Microscopy (SThM) to obtain an image of the temperature field of a silicon micro ring resonator with sub-micron spatial resolution. The temperature rise in the device is a result of self heating which is caused by free carrier absorption in the doped silicon. The temperature is measured locally and directly using a temperature sensitive AFM probe. We show that this local temperature measurement is feasible in the photonic device despite the perturbation that is introduced by the probe. Using the above method we observed a significant self heating of about 10 degrees within the device.

Direct measurement of the vortex migration caused by traveling magnetic wave

We studied the magnetisation of a 2 in. diameter YBCO thin film in the presence of traveling magnetic waves with six hall sensors. Simulation based on finite element method was conducted to reproduce the process of magnetisation. We discovered that the magnetisation of YBCO thin film based on traveling waves does not follow the constant current density assumption as used in the standing wave condition. We have shown that the traveling wave is more efficient in transporting the flux into the YBCO thin film, which suggests the potential of a flux injection device for high temperature superconducting coils. © 2014 AIP Publishing LLC.

Chirp-enhanced direct modulation of a monolithic sub-Terahertz dual laser transmitter

A technique enabling 10 Gbps data to be directly modulated onto a monolithic sub-THz dual laser transmitter is proposed. As a result of the laser chirp, the logical zeros of the resultant sub-THz signal have a different peak frequency from that of the logical ones. The signal extinction ratio is therefore enhanced by suppressing the logical zeros with a filter stage at the receiver. With the aid of the chirp-enhanced filtering, an improved extinction ratio can be achieved at moderate modulation current. Hence, 10 GHz modulation bandwidth of the transmitter is predicted without the need for external modulators. In this paper, we demonstrate the operational principle by generating an error-free (bit error rate less than 10-9) 100 Mbps Manchester encoded signal with a centre frequency of 12 GHz within the bandwidth of an envelope detector, whilst direct modulation of a 100 GHz signal at data rates of up to 10 Gbps is simulated by using a transmission line model. This work could be a key technique for enabling monolithic sub-THz transmitters to be readily used in high speed wireless links. © 2013 IEEE.

Identification of Materials from Construction Site Images Using Content Based Image Retrieval Techniques

The capability to automatically identify shapes, objects and materials from the image content through direct and indirect methodologies has enabled the development of several civil engineering related applications that assist in the design, construction and maintenance of construction projects. Examples include surface cracks detection, assessment of fire-damaged mortar, fatigue evaluation of asphalt mixes, aggregate shape measurements, velocimentry, vehicles detection, pore size distribution in geotextiles, damage detection and others. This capability is a product of the technological breakthroughs in the area of Image and Video Processing that has allowed for the development of a large number of digital imaging applications in all industries ranging from the well established medical diagnostic tools (magnetic resonance imaging, spectroscopy and nuclear medical imaging) to image searching mechanisms (image matching, content based image retrieval). Content based image retrieval techniques can also assist in the automated recognition of materials in construction site images and thus enable the development of reliable methods for image classification and retrieval. The amount of original imaging information produced yearly in the construction industry during the last decade has experienced a tremendous growth. Digital cameras and image databases are gradually replacing traditional photography while owners demand complete site photograph logs and engineers store thousands of images for each project to use in a number of construction management tasks. However, construction companies tend to store images without following any standardized indexing protocols, thus making the manual searching and retrieval a tedious and time-consuming effort. Alternatively, material and object identification techniques can be used for the development of automated, content based, construction site image retrieval methodology. These methods can utilize automatic material or object based indexing to remove the user from the time-consuming and tedious manual classification process. In this paper, a novel material identification methodology is presented. This method utilizes content based image retrieval concepts to match known material samples with material clusters within the image content. The results demonstrate the suitability of this methodology for construction site image retrieval purposes and reveal the capability of existing image processing technologies to accurately identify a wealth of materials from construction site images.

Shape Recognition of Linear Construction Entities from Construction Site Images

The capability to automatically identify shapes, objects and materials from the image content through direct and indirect methodologies has enabled the development of several civil engineering related applications that assist in the design, construction and maintenance of construction projects. This capability is a product of the technological breakthroughs in the area of Image Processing that has allowed for the development of a large number of digital imaging applications in all industries. In this paper, an automated and content based shape recognition model is presented. This model was devised to enhance the recognition capabilities of our existing material based image retrieval model. The shape recognition model is based on clustering techniques, and specifically those related with material and object segmentation. The model detects the borders of each previously detected material depicted in the image, examines its linearity (length/width ratio) and detects its orientation (horizontal/vertical). The results emonstrate the suitability of this model for construction site image retrieval purposes and reveal the capability of existing clustering technologies to accurately identify the shape of a wealth of materials from construction site images.

Direct chemical vapor deposition of large-area carbon thin films on gallium nitride for transparent electrodes: A first attempt

Direct formation of large-area carbon thin films on gallium nitride by chemical vapor deposition without metallic catalysts is demonstrated. A high flow of ammonia is used to stabilize the surface of the GaN (0001)/sapphire substrate during the deposition at 950°C. Various characterization methods verify that the synthesized thin films are largely sp 2 bonded, macroscopically uniform, and electrically conducting. The carbon thin films possess optical transparencies comparable to that of exfoliated graphene. This paper offers a viable route toward the use of carbon-based materials for future transparent electrodes in III-nitride optoelectronics, such as GaN-based light emitting diodes and laser diodes. © 1988-2012 IEEE.

Direct epitaxial growth of θ-Ni2Si by reaction of a thin Ni(10 at.% Pt) film with Si(1 0 0) substrate

The reaction between an 11 nm Ni(10 at.% Pt) film on a Si substrate has been examined by in situ X-ray diffraction (XRD), atom probe tomography (APT) and transmission electron microscopy (TEM). In situ XRD experiments show the unusual formation of a phase without an XRD peak through consumption of the metal. According to APT, this phase has an Si concentration gradient in accordance with the θ-Ni2Si metastable phase. TEM analysis confirms the direct formation of θ-Ni2Si in epitaxy on Si(1 0 0) with two variants of the epitaxial relationship. © 2014 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.