273 resultados para DIRAC ELECTRON

Observation of electron spin resonance phenomena in STM

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Crack advancement in a carbon-fibre epoxy composite observed by dynamic scanning electron microscopy

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Scanning tunnelling microscopy in a scanning electron microscope

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Direct observations of the micromechanisms of fracture in polymeric solids using the scanning electron microscope

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Computer aided techniques for topographical analysis in the scanning electron microscope

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Modulation efficiency and electron lifetimes in GaAs L.E.Ds

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Electron-electron interactions and doping dependence of the two-phonon Raman intensity in Graphene

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Room temperature electrometry with sub-10 electron charge resolution

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Room temperature single electron charging in single silicon nanochains

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Visualizing the uptake of C60 to the cytoplasm and nucleus of human monocyte-derived macrophage cells using energy-filtered transmission electron microscopy and electron tomography

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Optical phonons in nanotubes: electron-phonon coupling, Kohn anomalies, Peierls distortions and dynamic effects

Relevância:

20.00% 20.00%

Publicador:

Veja mais

An electron back scatter diffraction investigation of the crystallographic orientation of embedded nanoparticles within melt textured YBCO high temperature superconductors

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Direct growth of multi-walled carbon nanotubes on sharp tips for electron microscopy

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Direct growth of multi-walled carbon nanotubes on sharp tips for electron microscopy

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Field emission properties of self-assembled silicon nanostructures formed by electron beam annealing

Relevância:

20.00% 20.00%

Publicador:

Veja mais