On the relationship between hidden Markov Models and convex functional transforms for simulating scanning probe Microscopy

Models for simulating Scanning Probe Microscopy (SPM) may serve as a reference point for validating experimental data and practice. Generally, simulations use a microscopic model of the sample-probe interaction based on a first-principles approach, or a geometric model of macroscopic distortions due to the probe geometry. Examples of the latter include use of neural networks, the Legendre Transform, and dilation/erosion transforms from mathematical morphology. Dilation and the Legendre Transform fall within a general family of functional transforms, which distort a function by imposing a convex solution.In earlier work, the authors proposed a generalized approach to modeling SPM using a hidden Markov model, wherein both the sample-probe interaction and probe geometry may be taken into account. We present a discussion of the hidden Markov model and its relationship to these convex functional transforms for simulating and restoring SPM images.©2009 SPIE.

Synthesis of positive-real functions with low-complexity series-parallel networks

The purpose of this paper is to continue to develop the recently introduced concept of a regular positive-real function and its application to the classification of low-complexity two-terminal networks. This paper studies five- and six-element series-parallel networks with three reactive elements and presents a complete characterisation and graphical representation of the realisability conditions for these networks. The results are motivated by an approach to passive mechanical control which makes use of the inerter device. ©2009 IEEE.