On the relationship between hidden Markov Models and convex functional transforms for simulating scanning probe Microscopy

Models for simulating Scanning Probe Microscopy (SPM) may serve as a reference point for validating experimental data and practice. Generally, simulations use a microscopic model of the sample-probe interaction based on a first-principles approach, or a geometric model of macroscopic distortions due to the probe geometry. Examples of the latter include use of neural networks, the Legendre Transform, and dilation/erosion transforms from mathematical morphology. Dilation and the Legendre Transform fall within a general family of functional transforms, which distort a function by imposing a convex solution.In earlier work, the authors proposed a generalized approach to modeling SPM using a hidden Markov model, wherein both the sample-probe interaction and probe geometry may be taken into account. We present a discussion of the hidden Markov model and its relationship to these convex functional transforms for simulating and restoring SPM images.©2009 SPIE.

A process model based methodology to support conflict management

The product design development has increasingly become a collaborative process. Conflicts often appear in the design process due to multi-actors interactions. Therefore, a critical element of collaborative design would be conflict situations resolution. In this paper, a methodology, based on a process model, is proposed to support conflict management. This methodology deals mainly with the conflict resolution team identification and the solution impact evaluation issues. The proposed process model allows the design process traceability and the data dependencies network identification; which making it be possible to identify the conflict resolution actors as well as to evaluate the selected solution impact. Copyright © 2006 IFAC.