19 resultados para systems modeling


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The finite element method (FEM) is growing in popularity over the pressure diagram/hand calculation method for analysis of excavation systems in general and deep soil mixing excavations in particular. In this paper, a finite element analysis is used to study the behavior of a deep mixed excavation. Through the use of Plaxis (a FEM software program), the construction sequence is simulated by following the various construction phases allowing for deflections due to strut or anchor installation to be predicted. The numerical model used in this study simulates the soil cement columns as a continuous wall matching the bending stiffness of the actual wall. Input parameters based on laboratory tests and modeling assumptions are discussed. An example of the approach is illustrated using the Islais Creek Transport/Storage Project in San Francisco, California. Copyright ASCE 2006.

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From a hybrid systems point of view, we provide a modeling framework and a trajectory tracking control design methodology for juggling systems. We present the main ideas and concepts in a one degree-of-freedom juggler, which consists of a ball bouncing on an actuated robot. We design a hybrid control strategy that, with only information of the ball's state at impacts, controls the ball to track a reference rhythmic pattern with arbitrary precision. We extend this hybrid control strategy to the case of juggling multiple balls with different rhythmic patterns. Simulation results for juggling of one and three balls with a single actuated robot are presented. © 2007 IEEE.

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We investigate the dependency of electrostatic interaction forces on applied potentials in electrostatic force microscopy (EFM) as well as in related local potentiometry techniques such as Kelvin probe microscopy (KPM). The approximated expression of electrostatic interaction between two conductors, usually employed in EFM and KPM, may loose its validity when probe-sample distance is not very small, as often realized when realistic nanostructured systems with complex topography are investigated. In such conditions, electrostatic interaction does not depend solely on the potential difference between probe and sample, but instead it may depend on the bias applied to each conductor. For instance, electrostatic force can change from repulsive to attractive for certain ranges of applied potentials and probe-sample distances, and this fact cannot be accounted for by approximated models. We propose a general capacitance model, even applicable to more than two conductors, considering values of potentials applied to each of the conductors to determine the resulting forces and force gradients, being able to account for the above phenomenon as well as to describe interactions at larger distances. Results from numerical simulations and experiments on metal stripe electrodes and semiconductor nanowires supporting such scenario in typical regimes of EFM investigations are presented, evidencing the importance of a more rigorous modeling for EFM data interpretation. Furthermore, physical meaning of Kelvin potential as used in KPM applications can also be clarified by means of the reported formalism. © 2009 American Institute of Physics.

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This paper presents a novel method of using experimentally observed optical phenomena to reverse-engineer a model of the carbon nanofiber-addressed liquid crystal microlens array (C-MLA) using Zemax. It presents the first images of the optical profile for the C-MLA along the optic axis. The first working optical models of the C-MLA have been developed by matching the simulation results to the experimental results. This approach bypasses the need to know the exact carbon nanofiber-liquid crystal interaction and can be easily adapted to other systems where the nature of an optical device is unknown. Results show that the C-MLA behaves like a simple lensing system at 0.060-0.276 V/μm. In this lensing mode the C-MLA is successfully modeled as a reflective convex lens array intersecting with a flat reflective plane. The C-MLA at these field strengths exhibits characteristics of mostly spherical or low order aspheric arrays, with some aspects of high power aspherics. It also exhibits properties associated with varying lens apertures and strengths, which concur with previously theorized models based on E-field patterns. This work uniquely provides evidence demonstrating an apparent "rippling" of the liquid crystal texture at low field strengths, which were successfully reproduced using rippled Gaussian-like lens profiles. © 2014 Published by Elsevier B.V.