24 resultados para Stock inspection.


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Camera motion estimation is one of the most significant steps for structure-from-motion (SFM) with a monocular camera. The normalized 8-point, the 7-point, and the 5-point algorithms are normally adopted to perform the estimation, each of which has distinct performance characteristics. Given unique needs and challenges associated to civil infrastructure SFM scenarios, selection of the proper algorithm directly impacts the structure reconstruction results. In this paper, a comparison study of the aforementioned algorithms is conducted to identify the most suitable algorithm, in terms of accuracy and reliability, for reconstructing civil infrastructure. The free variables tested are baseline, depth, and motion. A concrete girder bridge was selected as the "test-bed" to reconstruct using an off-the-shelf camera capturing imagery from all possible positions that maximally the bridge's features and geometry. The feature points in the images were extracted and matched via the SURF descriptor. Finally, camera motions are estimated based on the corresponding image points by applying the aforementioned algorithms, and the results evaluated.

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This paper presents an analytical modeling technique for the simulation of long-range ultrasonic guided waves in structures. The model may be used to predict the displacement field in a prismatic structure arising from any excitation arrangement and may therefore be used as a tool to design new inspection systems. It is computationally efficient and relatively simple to implement, yet gives accuracy similar to finite element analysis and semi-analytical finite element analysis methods. The model has many potential applications; one example is the optimization of part-circumferential arrays where access to the full circumference of the pipe is restricted. The model has been successfully validated by comparison with finite element solutions. Experimental validation has also been carried out using an array of piezoelectric transducer elements to measure the displacement field arising from a single transducer element in an 88.9-mm-diameter pipe. Good agreement has been obtained between the two models and the experimental data.

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Large concrete structures need to be inspected in order to assess their current physical and functional state, to predict future conditions, to support investment planning and decision making, and to allocate limited maintenance and rehabilitation resources. Current procedures in condition and safety assessment of large concrete structures are performed manually leading to subjective and unreliable results, costly and time-consuming data collection, and safety issues. To address these limitations, automated machine vision-based inspection procedures have increasingly been proposed by the research community. This paper presents current achievements and open challenges in vision-based inspection of large concrete structures. First, the general concept of Building Information Modeling is introduced. Then, vision-based 3D reconstruction and as-built spatial modeling of concrete civil infrastructure are presented. Following that, the focus is set on structural member recognition as well as on concrete damage detection and assessment exemplified for concrete columns. Although some challenges are still under investigation, it can be concluded that vision-based inspection methods have significantly improved over the last 10 years, and now, as-built spatial modeling as well as damage detection and assessment of large concrete structures have the potential to be fully automated.

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Liquid crystal on silicon (LCOS) is one of the most exciting technologies, combining the optical modulation characteristics of liquid crystals with the power and compactness of a silicon backplane. The objective of our work is to improve cell assembly and inspection methods by introducing new equipment for automated assembly and by using an optical inspection microscope. A Suss-MicroTec Universal device bonder is used for precision assembly and device packaging and an Olympus BX51 high resolution microscope is employed for device inspection. © 2009 Optical Society of America.