81 resultados para Atomic size contacts

Modelling aerosol nucleation and growth using an assumed size distribution

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Gesture recognition under small sample size

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Measurement and dispersion behaviour of particles in various size ranges between 5-1000 nm in a Cambridge street canyon

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Automated analysis of populations of ionotropic receptors, imaged by atomic force microscopy

Relevância:

20.00% 20.00%

Publicador:

Veja mais

The effect of age and font size on reading text on handheld computers

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Atomic structure, interfaces and defects of high dielectric constant gate oxides

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Construction of an ultrahigh vacuum scanning tunnelling microscope (UHVSTM) for atomic-level characterization of magnetic systems

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Molecular size effect of additives on the electro-optical properties of eutectic liquid crystal mixtures

Relevância:

20.00% 20.00%

Publicador:

Veja mais

A novel ferroelectric FET based memory cell of minimum size and non-destructive reading

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Atomic structure, band offset engineering, and hydrogen at High-K oxide: Si interfaces

Relevância:

20.00% 20.00%

Publicador:

Veja mais

The measurement of particle size distribution using the Single Particle Optical Sizing (SPOS) method

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Size effects in the fracture of metallic foams

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Mechanisms of abrasive wear in lubricated contacts

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Scanning electron and atomic force microscopy measurements of ion beam etched InP samples using Ar/H2 chemistry

Relevância:

20.00% 20.00%

Publicador:

Veja mais

Surface assessment of a chemically assisted ion beam etched InP sample using scanning electron microscopy and atomic force microscopy techniques

Relevância:

20.00% 20.00%

Publicador:

Veja mais