23 resultados para 12-113


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Describes a study that set out to evaluate the performance impact of a SAP R3 implementation. The SAP system was implemented by a major multinational business in four of its European plants. Qualitative and quantitative data were collected over a two-year period, through surveys and interviews with systems users and by accessing company records. While users were able to identify the operational benefits of SAP, they were still doubtful at the end of the evaluation process whether the system had resulted in any significant positive financial benefits for the business. Two themes related to this observation are explored. First the time lag between operational improvements and subsequent financial impact. Second the importance of learning as a means of reducing the time lag. Learning in this context is a multi-dimensional concept and covers learning how to use the system, learning how to improve the system and learning how to improve the implementation process.

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Model-based approaches to handling additive background noise and channel distortion, such as Vector Taylor Series (VTS), have been intensively studied and extended in a number of ways. In previous work, VTS has been extended to handle both reverberant and background noise, yielding the Reverberant VTS (RVTS) scheme. In this work, rather than assuming the observation vector is generated by the reverberation of a sequence of background noise corrupted speech vectors, as in RVTS, the observation vector is modelled as a superposition of the background noise and the reverberation of clean speech. This yields a new compensation scheme RVTS Joint (RVTSJ), which allows an easy formulation for joint estimation of both additive and reverberation noise parameters. These two compensation schemes were evaluated and compared on a simulated reverberant noise corrupted AURORA4 task. Both yielded large gains over VTS baseline system, with RVTSJ outperforming the previous RVTS scheme. © 2011 IEEE.

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Ferroelectric thin films have been intensively studied at the nanometre scale due to the application in many fields, such as non-volatile memories. Enhanced piezo-response force microscopy (E-PFM) was used to investigate the evolution of ferroelectric and ferroelastic nanodomains in a polycrystalline thin film of the simple multi-ferroic PbZr0.3Ti0.7O 3 (PZT). By applying a d.c. voltage between the atomic force microscopy (AFM) tip and the bottom substrate of the sample, we created an electric field to switch the domain orientation. Reversible switching of both ferroelectric and ferroelastic domains towards particular directions with predominantly (111) domain orientations are observed. We also showed that along with the ferroelectric/ferroelastic domain switch, there are defects that also switch. Finally, we proposed the possible explanation of this controllable defect in terms of flexoelectricity and defect pinning. © 2013 IEEE.