Short-channel polymer field-effect-transistor fabrication using spin-coating-induced edge template and ink-jet printing

A method to fabricate polymer field-effect transistors with submicron channel lengths is described. A thin polymer film is spin coated on a prepatterned resist with a low resolution to create a thickness contrast in the overcoated polymer layer. After plasma and solvent etching, a submicron-sized line structure, which templates the contour of the prepattern, is obtained. A further lift-off process is applied to define source-drain electrodes of transistors. With a combination of ink-jet printing, transistors with channel length down to 400 nm have been fabricated by this method. We show that drive current density increases as expected, while the on/off current ratio 106 is achieved. © 2005 American Institute of Physics.

Durability study of eleven years old cement-bentonite cut-off wall material

Comprehensive understanding of the long-term performance of cement-bentonite slurry trench cut-off walls is essential as these mixes may degrade when exposed to aggressive environments or when subjected to prolonged drying. A series of wetting-drying and immersion experiments was carried out to evaluate the durability characteristics of laboratory mixed samples and block field samples from 40 days to 11 years of age. For the wetting-drying tests, the samples buried in medium graded sand were subjected to periodical flooding and drying cycles. They were then used for permeability testing and unconfined compressive strength (UCS) testing. For the immersion tests, the samples confined in perforated molds were submerged in magnesium sulfate solution for 16 weeks and their microstructures were then analyzed using X-ray diffraction (XRD) technique. This paper identifies the effects of contaminant exposure on durability of cement-bentonite and the effects of aging by comparing 11 years old samples to younger samples. Test results showed that young or previously contaminated cement-bentonite mixes are more susceptible to sulfate attack than old or less contaminated mixes. Copyright ASCE 2008.

Self-aligned high-resolution printed polymer transistors

A process to fabricate solution-processable thin-film transistors (TFTs) with a one-step self-aligned definition of the dimensions in all functional layers is demonstrated. The TFT-channel, semiconductor materials, and effective gate dimention of different layers are determined by a one-step imprint process and the subsequent pattern transfer without the need for multiple patterning and mask alignment. The process is compatible with fabrication of large-scale circuits. Copyright © 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Satellite formation in drop-on-demand printing of polymer solutions

High speed photographic images of jets formed from dilute solutions of polystyrene in diethyl phthalate ejected from a piezoelectric drop-on-demand inkjet head have been analyzed in order to study the formation and distribution of drops as the ligament collapses. Particular attention has been paid to satellite drops, and their relative separation and sizes. The effect of polymer concentration was investigated. The distribution of nearest-neighbour centre spacing between the drops formed from the ligament is better described by a 2-parameter modified gamma distribution than by a Gaussian distribution. There are (at least) two different populations of satellite size relative to the main drop size formed at normal jetting velocities, with ratios of about three between the diameters of the main drop and the successive satellite sizes. The distribution of the differences in drop size between neighbouring drops is close to Gaussian, with a small non-zero mean for low polymer concentrations, which is associated with the conical shape of the ligament prior to its collapse and the formation of satellites. Higher polymer concentrations result in slower jets for the same driving impulse, and also a tendency to form ligaments with a near-constant width. Under these conditions the mean of the distribution of differences in nearest-neighbour drop size was zero.