184 resultados para Plastic products
Resumo:
A constitutive equation is developed for geometrically-similar sharp indentation of a material capable of elastic, viscous, and plastic deformation. The equation is based on a series of elements consisting of a quadratic (reversible) spring, a quadratic (time-dependent, reversible) dashpot, and a quadratic (time-independent, irreversible) slider-essentially modifying a model for an elastic-perfectly plastic material by incorporating a creeping component. Load-displacement solutions to the constitutive equation are obtained for load-controlled indentation during constant loading-rate testing. A characteristic of the responses is the appearance of a forward-displacing "nose" during unloading of load-controlled systems (e.g., magnetic-coil-driven "nanoindentation" systems). Even in the absence of this nose, and the associated initial negative unloading tangent, load-displacement traces (and hence inferred modulus and hardness values) are significantly perturbed on the addition of the viscous component. The viscous-elastic-plastic (VEP) model shows promise for obtaining material properties (elastic modulus, hardness, time-dependence) of time-dependent materials during indentation experiments.
Resumo:
This paper introduces the Interlevel Product (ILP) which is a transform based upon the Dual-Tree Complex Wavelet. Coefficients of the ILP have complex values whose magnitudes indicate the amplitude of multilevel features, and whose phases indicate the nature of these features (e.g. ridges vs. edges). In particular, the phases of ILP coefficients are approximately invariant to small shifts in the original images. We accordingly introduce this transform as a solution to coarse scale template matching, where alignment concerns between decimation of a target and decimation of a larger search image can be mitigated, and computational efficiency can be maintained. Furthermore, template matching with ILP coefficients can provide several intuitive "near-matches" that may be of interest in image retrieval applications. © 2005 IEEE.