Enforcing RFID data visibility restrictions using XACML security policies

Radio Frequency Identification (RFID) technology allows automatic data capture from tagged objects moving in a supply chain. This data can be very useful if it is used to answer traceability queries, however it is distributed across many different repositories, owned by different companies. © 2012 IEEE.

Optimal constraint tightening policies for robust variable horizon model predictive control

This paper develops a technique for improving the region of attraction of a robust variable horizon model predictive controller. It considers a constrained discrete-time linear system acted upon by a bounded, but unknown time-varying state disturbance. Using constraint tightening for robustness, it is shown how the tightening policy, parameterised as direct feedback on the disturbance, can be optimised to increase the volume of an inner approximation to the controller's true region of attraction. Numerical examples demonstrate the benefits of the policy in increasing region of attraction volume and decreasing the maximum prediction horizon length. © 2012 IEEE.

Expressive RFID data access policies for the Pharmaceuticals supply chain

The Pharma(ceuticals) industry is at a cross-roads. There are growing concerns that illegitimate products are penetrating the supply chain. There are proposals in many countries to apply RFID and other traceability technologies to solve this problem. However there are several trade-offs and one of the most crucial is between data visibility and confidentiality. In this paper, we use the TrakChain assessment framework tools to study the US Pharma supply chain and to compare candidate solutions to achieve traceability data security: Point-of-Dispense Authentication, Network-based electronic Pedigree, and Document-based electronic Pedigree. We also propose extensions to a supply chain authorization language that is able to capture expressive data sharing conditions considered necessary by the industry's trading partners. © 2013 IEEE.