The 15th International Geological Congress, South Africa (1929): The Resurgence of Wegener’s Continental Drift Theory

The 15th International Geological Congress was held in South Africa in 1929. Many interesting issues were tackled, thanks to the development of geophysical techniques, ideas about magmatic differentiation, and the origin of the Karroo System, among others. The importance of the Congress from the point of view of the history of geology lies in the fact that an ‘inflection point’ occurred as regards thinking about the continental drift theory that had been proposed by Wegener a few years earlier. It can be said that the contributions of Du Toit allowed a deepening in the theoretical bases of this scientific hypothesis, which celebrated its first hundred years in 2012.

A theory of electron collection by a grid sphere

Use of a spherical grid as electron collector at the anodic end of a tether, as recently proposed, is considered. The standard analysis of space-charge limited current to a solid sphere (with neither magnetic nor plasma-motion effects), which has been shown to best fit TSS1R in-orbit results at very high bias, is used to determine effects from grid transparency on current collected; the analysis is first reformulated in the formalism recently introduced in the two-dimensional analysis of bare-tethers. A discussion of the electric potential created by a spherical grid in vacuum is then carried out; it is shown that each grid-wire collects current well below its maximum OML current, the effective grid transparency being close to its optical value. Formulae for the current to a spherical grid, showing the effects of grid transparency, is determined. A fully consistent analysis of electric potential and electron density, outside and inside the grid, is completed.

A taxonomic tool for identifying needle remains of south-western European Pinus species of the Late Quaternary

Primer trabajo a nivel mundial sobre la diferenciación de especies de Pinus con clave dicotómica a través de la estructura cuticular

A taxonomic tool for identifying needle remains of south-western European Pinus species of the Late Quaternary

This work provides a tool whereby the needle remains of native, south-western European Pinus spp. can be easily identified from species-specific epidermal features. To construct this tool, the needles of P. uncinata, P. sylvestris, P. nigra, P. pinaster, P. pinea and P. halepensis were gathered across the Northern Hemisphere range of each taxon and compared with non-indigenous trees growing in two South Australian Botanic Gardens. Three needles from each of these species were taken from three adult trees growing at three different localities. Light microscopy was used to observe the key epidermal and stomatal features of the needles. To improve interpretation, additional scanning electron microscopy samples were prepared. Epidermal features, including variation in the diameter of the epistomatal chamber aperture (pore), are described. A taxonomic key based on the size, shape and arrangement of the subsidiary cells of the stomatal complexes was constructed. This key enables the identification of pine needle fragments at the species level (except those belonging to the group P. gr. nigra-uncinata). Despite their overlapping range, pore size was helpful in distinguishing between P. nigra and P. uncinata and between three groups of species. Isolated stomata were also observed. Cluster and discriminant analyses of stomatal variables described in earlier studies were performed. Overlap in guard cell variables hampers species-level identification of isolated stomata. Species discrimination is improved if groups of ecological affinity are considered.

Determination of a refractive index and an extinction coefficient of standard production of CVD-graphene

The refractive index and extinction coefficient of chemical vapour deposition grown graphene are determined by ellipsometry analysis. Graphene films were grown on copper substrates and transferred as both monolayers and bilayers onto SiO2/Si substrates by using standard manufacturing procedures. The chemical nature and thickness of residual debris formed after the transfer process were elucidated using photoelectron spectroscopy. The real layered structure so deduced has been used instead of the nominal one as the input in the ellipsometry analysis of monolayer and bilayer graphene, transferred onto both native and thermal silicon oxide. The effect of these contamination layers on the optical properties of the stacked structure is noticeable both in the visible and the ultraviolet spectral regions, thus masking the graphene optical response. Finally, the use of heat treatment under a nitrogen atmosphere of the graphene-based stacked structures, as a method to reduce the water content of the sample, and its effect on the optical response of both graphene and the residual debris layer are presented. The Lorentz-Drude model proposed for the optical response of graphene fits fairly well the experimental ellipsometric data for all the analysed graphene-based stacked structures.