2 resultados para Prime-boost

em Universidad Politécnica de Madrid


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Several boost-derived topologies are analyzed and compared for an aerospace application that uses a 100 V voltage bus. All these topologies have been designed and optimized considering the electrical requirements and the reduced number of space-qualified components. The comparison evaluates the power losses, mass, and dynamic response. Special attention has been paid to those topologies that may cancel the inherent right half plane zero (RHP) zero of the boost topology. Experimental results of the less common topologies are presented.

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Strained fin is one of the techniques used to improve the devices as their size keeps reducing in new nanoscale nodes. In this paper, we use a predictive technology of 14 nm where pMOS mobility is significantly improved when those devices are built on top of long, uncut fins, while nMOS devices present the opposite behavior due to the combination of strains. We explore the possibility of boosting circuit performance in repetitive structures where long uncut fins can be exploited to increase fin strain impact. In particular, pMOS pass-gates are used in 6T complementary SRAM cells (CSRAM) with reinforced pull-ups. Those cells are simulated under process variability and compared to the regular SRAM. We show that when layout dependent effects are considered the CSRAM design provides 10% to 40% faster access time while keeping the same area, power, and stability than a regular 6T SRAM cell. The conclusions also apply to 8T SRAM cells. The CSRAM cell also presents increased reliability in technologies whose nMOS devices have more mismatch than pMOS transistors.