1 resultado para test de elección múltiple
em Massachusetts Institute of Technology
Filtro por publicador
- JISC Information Environment Repository (3)
- Repository Napier (1)
- Aberystwyth University Repository - Reino Unido (1)
- Adam Mickiewicz University Repository (1)
- Andina Digital - Repositorio UASB-Digital - Universidade Andina Simón Bolívar (1)
- Aquatic Commons (20)
- Archivo Digital para la Docencia y la Investigación - Repositorio Institucional de la Universidad del País Vasco (21)
- Biblioteca Digital | Sistema Integrado de Documentación | UNCuyo - UNCUYO. UNIVERSIDAD NACIONAL DE CUYO. (1)
- Biblioteca Digital da Produção Intelectual da Universidade de São Paulo (1)
- Biblioteca Digital de la Universidad Católica Argentina (3)
- Boston University Digital Common (2)
- Brock University, Canada (12)
- CaltechTHESIS (1)
- Cámara de Comercio de Bogotá, Colombia (11)
- Cambridge University Engineering Department Publications Database (91)
- Chinese Academy of Sciences Institutional Repositories Grid Portal (74)
- Cochin University of Science & Technology (CUSAT), India (1)
- CORA - Cork Open Research Archive - University College Cork - Ireland (3)
- DI-fusion - The institutional repository of Université Libre de Bruxelles (5)
- Duke University (5)
- eResearch Archive - Queensland Department of Agriculture; Fisheries and Forestry (10)
- FAUBA DIGITAL: Repositorio institucional científico y académico de la Facultad de Agronomia de la Universidad de Buenos Aires (2)
- Funes: Repositorio digital de documentos en Educación Matemática - Colombia (1)
- Greenwich Academic Literature Archive - UK (7)
- Helda - Digital Repository of University of Helsinki (9)
- Helvia: Repositorio Institucional de la Universidad de Córdoba (1)
- Indian Institute of Science - Bangalore - Índia (62)
- Infoteca EMBRAPA (1)
- Instituto Politécnico do Porto, Portugal (9)
- Martin Luther Universitat Halle Wittenberg, Germany (1)
- Massachusetts Institute of Technology (1)
- Ministerio de Cultura, Spain (115)
- Plymouth Marine Science Electronic Archive (PlyMSEA) (5)
- Portal de Revistas Científicas Complutenses - Espanha (3)
- QUB Research Portal - Research Directory and Institutional Repository for Queen's University Belfast (227)
- Queensland University of Technology - ePrints Archive (180)
- Repositório Científico da Universidade de Évora - Portugal (1)
- Repositorio Institucional de la Universidad Nacional Agraria (3)
- Repositorio Institucional de la Universidad Pública de Navarra - Espanha (1)
- RIBERDIS - Repositorio IBERoamericano sobre DIScapacidad - Centro Español de Documentación sobre Discapacidad (CEDD) (1)
- RUN (Repositório da Universidade Nova de Lisboa) - FCT (Faculdade de Cienecias e Technologia), Universidade Nova de Lisboa (UNL), Portugal (2)
- School of Medicine, Washington University, United States (1)
- Scielo España (1)
- South Carolina State Documents Depository (1)
- Universidad Autónoma de Nuevo León, Mexico (14)
- Universidad de Alicante (4)
- Universidad del Rosario, Colombia (6)
- Universidad Politécnica de Madrid (3)
- Universidade de Lisboa - Repositório Aberto (1)
- Universidade dos Açores - Portugal (1)
- Universitat de Girona, Spain (11)
- Universitätsbibliothek Kassel, Universität Kassel, Germany (2)
- Université de Lausanne, Switzerland (13)
- Université de Montréal, Canada (26)
- Université Laval Mémoires et thèses électroniques (1)
- University of Southampton, United Kingdom (9)
- University of Washington (1)
- Worcester Research and Publications - Worcester Research and Publications - UK (1)
Resumo:
This thesis presents a new approach to building a design for testability (DFT) system. The system takes a digital circuit description, finds out the problems in testing it, and suggests circuit modifications to correct those problems. The key contributions of the thesis research are (1) setting design for testability in the context of test generation (TG), (2) using failures during FG to focus on testability problems, and (3) relating circuit modifications directly to the failures. A natural functionality set is used to represent the maximum functionalities that a component can have. The current implementation has only primitive domain knowledge and needs other work as well. However, armed with the knowledge of TG, it has already demonstrated its ability and produced some interesting results on a simple microprocessor.