2 resultados para sampling error

em Massachusetts Institute of Technology


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Object recognition is complicated by clutter, occlusion, and sensor error. Since pose hypotheses are based on image feature locations, these effects can lead to false negatives and positives. In a typical recognition algorithm, pose hypotheses are tested against the image, and a score is assigned to each hypothesis. We use a statistical model to determine the score distribution associated with correct and incorrect pose hypotheses, and use binary hypothesis testing techniques to distinguish between them. Using this approach we can compare algorithms and noise models, and automatically choose values for internal system thresholds to minimize the probability of making a mistake.

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We present a new method for estimating the expected return of a POMDP from experience. The estimator does not assume any knowle ge of the POMDP and allows the experience to be gathered with an arbitrary set of policies. The return is estimated for any new policy of the POMDP. We motivate the estimator from function-approximation and importance sampling points-of-view and derive its theoretical properties. Although the estimator is biased, it has low variance and the bias is often irrelevant when the estimator is used for pair-wise comparisons.We conclude by extending the estimator to policies with memory and compare its performance in a greedy search algorithm to the REINFORCE algorithm showing an order of magnitude reduction in the number of trials required.