3 resultados para objective tests

em Massachusetts Institute of Technology


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When stimuli presented to the two eyes differ considerably, stable binocular fusion fails, and the subjective percept alternates between the two monocular images, a phenomenon known as binocular rivalry. The influence of attention over this perceptual switching has long been studied, and although there is evidence that attention can affect the alternation rate, its role in the overall dynamics of the rivalry process remains unclear. The present study investigated the relationship between the attention paid to the rivalry stimulus, and the dynamics of the perceptual alternations. Specifically, the temporal course of binocular rivalry was studied as the subjects performed difficult nonvisual and visual concurrent tasks, directing their attention away from the rivalry stimulus. Periods of complete perceptual dominance were compared for the attended condition, where the subjects reported perceptual changes, and the unattended condition, where one of the simultaneous tasks was performed. During both the attended and unattended conditions, phases of rivalry dominance were obtained by analyzing the subject"s optokinetic nystagmus recorded by an electrooculogram, where the polarity of the nystagmus served as an objective indicator of the perceived direction of motion. In all cases, the presence of a difficult concurrent task had little or no effect on the statistics of the alternations, as judged by two classic tests of rivalry, although the overall alternation rate showed a small but significant increase with the concurrent task. It is concluded that the statistical patterns of rivalry alternations are not governed by attentional shifts or decision-making on the part of the subject.

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We introduce and explore an approach to estimating statistical significance of classification accuracy, which is particularly useful in scientific applications of machine learning where high dimensionality of the data and the small number of training examples render most standard convergence bounds too loose to yield a meaningful guarantee of the generalization ability of the classifier. Instead, we estimate statistical significance of the observed classification accuracy, or the likelihood of observing such accuracy by chance due to spurious correlations of the high-dimensional data patterns with the class labels in the given training set. We adopt permutation testing, a non-parametric technique previously developed in classical statistics for hypothesis testing in the generative setting (i.e., comparing two probability distributions). We demonstrate the method on real examples from neuroimaging studies and DNA microarray analysis and suggest a theoretical analysis of the procedure that relates the asymptotic behavior of the test to the existing convergence bounds.

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This thesis describes two programs for generating tests for digital circuits that exploit several kinds of expert knowledge not used by previous approaches. First, many test generation problems can be solved efficiently using operation relations, a novel representation of circuit behavior that connects internal component operations with directly executable circuit operations. Operation relations can be computed efficiently by searching traces of simulated circuit behavior. Second, experts write test programs rather than test vectors because programs are more readable and compact. Test programs can be constructed automatically by merging program fragments using expert-supplied goal-refinement rules and domain-independent planning techniques.