Using Structural and Functional Information in Diagnostic Design

We wish to design a diagnostic for a device from knowledge of its structure and function. the diagnostic should achieve both coverage of the faults that can occur in the device, and should strive to achieve specificity in its diagnosis when it detects a fault. A system is described that uses a simple model of hardware structure and function, representing the device in terms of its internal primitive functions and connections. The system designs a diagnostic in three steps. First, an extension of path sensitization is used to design a test for each of the connections in teh device. Next, the resulting tests are improved by increasing their specificity. Finally the tests are ordered so that each relies on the fewest possible connections. We describe an implementation of this system and show examples of the results for some simple devices.

Permutation Tests for Classification

We introduce and explore an approach to estimating statistical significance of classification accuracy, which is particularly useful in scientific applications of machine learning where high dimensionality of the data and the small number of training examples render most standard convergence bounds too loose to yield a meaningful guarantee of the generalization ability of the classifier. Instead, we estimate statistical significance of the observed classification accuracy, or the likelihood of observing such accuracy by chance due to spurious correlations of the high-dimensional data patterns with the class labels in the given training set. We adopt permutation testing, a non-parametric technique previously developed in classical statistics for hypothesis testing in the generative setting (i.e., comparing two probability distributions). We demonstrate the method on real examples from neuroimaging studies and DNA microarray analysis and suggest a theoretical analysis of the procedure that relates the asymptotic behavior of the test to the existing convergence bounds.

Generating Circuit Tests by Exploiting Designed Behavior

This thesis describes two programs for generating tests for digital circuits that exploit several kinds of expert knowledge not used by previous approaches. First, many test generation problems can be solved efficiently using operation relations, a novel representation of circuit behavior that connects internal component operations with directly executable circuit operations. Operation relations can be computed efficiently by searching traces of simulated circuit behavior. Second, experts write test programs rather than test vectors because programs are more readable and compact. Test programs can be constructed automatically by merging program fragments using expert-supplied goal-refinement rules and domain-independent planning techniques.