3 resultados para Schema Matching
em Massachusetts Institute of Technology
Resumo:
We describe a method for modeling object classes (such as faces) using 2D example images and an algorithm for matching a model to a novel image. The object class models are "learned'' from example images that we call prototypes. In addition to the images, the pixelwise correspondences between a reference prototype and each of the other prototypes must also be provided. Thus a model consists of a linear combination of prototypical shapes and textures. A stochastic gradient descent algorithm is used to match a model to a novel image by minimizing the error between the model and the novel image. Example models are shown as well as example matches to novel images. The robustness of the matching algorithm is also evaluated. The technique can be used for a number of applications including the computation of correspondence between novel images of a certain known class, object recognition, image synthesis and image compression.
Resumo:
We describe a technique for finding pixelwise correspondences between two images by using models of objects of the same class to guide the search. The object models are 'learned' from example images (also called prototypes) of an object class. The models consist of a linear combination ofsprototypes. The flow fields giving pixelwise correspondences between a base prototype and each of the other prototypes must be given. A novel image of an object of the same class is matched to a model by minimizing an error between the novel image and the current guess for the closest modelsimage. Currently, the algorithm applies to line drawings of objects. An extension to real grey level images is discussed.
Resumo:
We present a new method to perform reliable matching between different images. This method exploits a projective invariant property between concentric circles and the corresponding projected ellipses to find complete region correspondences centered on interest points. The method matches interest points allowing for a full perspective transformation and exploiting all the available luminance information in the regions. Experiments have been conducted on many different data sets to compare our approach to SIFT local descriptors. The results show the new method offers increased robustness to partial visibility, object rotation in depth, and viewpoint angle change.