Surface Reflectance Estimation and Natural Illumination Statistics

Humans recognize optical reflectance properties of surfaces such as metal, plastic, or paper from a single image without knowledge of illumination. We develop a machine vision system to perform similar recognition tasks automatically. Reflectance estimation under unknown, arbitrary illumination proves highly underconstrained due to the variety of potential illumination distributions and surface reflectance properties. We have found that the spatial structure of real-world illumination possesses some of the statistical regularities observed in the natural image statistics literature. A human or computer vision system may be able to exploit this prior information to determine the most likely surface reflectance given an observed image. We develop an algorithm for reflectance classification under unknown real-world illumination, which learns relationships between surface reflectance and certain features (statistics) computed from a single observed image. We also develop an automatic feature selection method.

Permutation Tests for Classification

We introduce and explore an approach to estimating statistical significance of classification accuracy, which is particularly useful in scientific applications of machine learning where high dimensionality of the data and the small number of training examples render most standard convergence bounds too loose to yield a meaningful guarantee of the generalization ability of the classifier. Instead, we estimate statistical significance of the observed classification accuracy, or the likelihood of observing such accuracy by chance due to spurious correlations of the high-dimensional data patterns with the class labels in the given training set. We adopt permutation testing, a non-parametric technique previously developed in classical statistics for hypothesis testing in the generative setting (i.e., comparing two probability distributions). We demonstrate the method on real examples from neuroimaging studies and DNA microarray analysis and suggest a theoretical analysis of the procedure that relates the asymptotic behavior of the test to the existing convergence bounds.

Test Generation Guided Design for Testability

This thesis presents a new approach to building a design for testability (DFT) system. The system takes a digital circuit description, finds out the problems in testing it, and suggests circuit modifications to correct those problems. The key contributions of the thesis research are (1) setting design for testability in the context of test generation (TG), (2) using failures during FG to focus on testability problems, and (3) relating circuit modifications directly to the failures. A natural functionality set is used to represent the maximum functionalities that a component can have. The current implementation has only primitive domain knowledge and needs other work as well. However, armed with the knowledge of TG, it has already demonstrated its ability and produced some interesting results on a simple microprocessor.