2 resultados para Optical measurements.
em Massachusetts Institute of Technology
Resumo:
In the first part of this paper we show that a new technique exploiting 1D correlation of 2D or even 1D patches between successive frames may be sufficient to compute a satisfactory estimation of the optical flow field. The algorithm is well-suited to VLSI implementations. The sparse measurements provided by the technique can be used to compute qualitative properties of the flow for a number of different visual tsks. In particular, the second part of the paper shows how to combine our 1D correlation technique with a scheme for detecting expansion or rotation ([5]) in a simple algorithm which also suggests interesting biological implications. The algorithm provides a rough estimate of time-to-crash. It was tested on real image sequences. We show its performance and compare the results to previous approaches.
Resumo:
Nanoporous GaN films are prepared by UV assisted electrochemical etching using HF solution as an electrolyte. To assess the optical quality and morphology of these nanoporous films, micro-photoluminescence (PL), micro-Raman scattering, scanning electron microscopy (SEM), and atomic force microscopy (AFM) techniques have been employed. SEM and AFM measurements revealed an average pore size of about 85-90 nm with a transverse dimension of 70-75 nm. As compared to the as-grown GaN film, the porous layer exhibits a substantial photoluminescence intensity enhancement with a partial relaxation of compressive stress. Such a stress relaxation is further confirmed by the red shifted E₂(TO) phonon peak in the Raman spectrum of porous GaN.