2 resultados para MATCHED GENERATION

em Massachusetts Institute of Technology


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Template matching by means of cross-correlation is common practice in pattern recognition. However, its sensitivity to deformations of the pattern and the broad and unsharp peaks it produces are significant drawbacks. This paper reviews some results on how these shortcomings can be removed. Several techniques (Matched Spatial Filters, Synthetic Discriminant Functions, Principal Components Projections and Reconstruction Residuals) are reviewed and compared on a common task: locating eyes in a database of faces. New variants are also proposed and compared: least squares Discriminant Functions and the combined use of projections on eigenfunctions and the corresponding reconstruction residuals. Finally, approximation networks are introduced in an attempt to improve filter design by the introduction of nonlinearity.

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This thesis presents a new approach to building a design for testability (DFT) system. The system takes a digital circuit description, finds out the problems in testing it, and suggests circuit modifications to correct those problems. The key contributions of the thesis research are (1) setting design for testability in the context of test generation (TG), (2) using failures during FG to focus on testability problems, and (3) relating circuit modifications directly to the failures. A natural functionality set is used to represent the maximum functionalities that a component can have. The current implementation has only primitive domain knowledge and needs other work as well. However, armed with the knowledge of TG, it has already demonstrated its ability and produced some interesting results on a simple microprocessor.