Model-Based Troubleshooting of Digital Systems

This thesis describes a methodology, a representation, and an implemented program for troubleshooting digital circuit boards at roughly the level of expertise one might expect in a human novice. Existing methods for model-based troubleshooting have not scaled up to deal with complex circuits, in part because traditional circuit models do not explicitly represent aspects of the device that troubleshooters would consider important. For complex devices the model of the target device should be constructed with the goal of troubleshooting explicitly in mind. Given that methodology, the principal contributions of the thesis are ways of representing complex circuits to help make troubleshooting feasible. Temporally coarse behavior descriptions are a particularly powerful simplification. Instantiating this idea for the circuit domain produces a vocabulary for describing digital signals. The vocabulary has a level of temporal detail sufficient to make useful predictions abut the response of the circuit while it remains coarse enough to make those predictions computationally tractable. Other contributions are principles for using these representations. Although not embodied in a program, these principles are sufficiently concrete that models can be constructed manually from existing circuit descriptions such as schematics, part specifications, and state diagrams. One such principle is that if there are components with particularly likely failure modes or failure modes in which their behavior is drastically simplified, this knowledge should be incorporated into the model. Further contributions include the solution of technical problems resulting from the use of explicit temporal representations and design descriptions with tangled hierarchies.

Thermal control of electronics: Perspectives and prospects

One of the most prominent industrial applications of heat transfer science and engineering has been electronics thermal control. Driven by the relentless increase in spatial density of microelectronic devices, integrated circuit chip powers have risen by a factor of 100 over the past twenty years, with a somewhat smaller increase in heat flux. The traditional approaches using natural convection and forced-air cooling are becoming less viable as power levels increase. This paper provides a high-level overview of the thermal management problem from the perspective of a practitioner, as well as speculation on the prospects for electronics thermal engineering in years to come.

Preliminary Characterisation of Low-Temperature Bonded Copper Interconnects for 3-D Integrated Circuits

Three dimensional (3-D) integrated circuits can be fabricated by bonding previously processed device layers using metal-metal bonds that also serve as layer-to-layer interconnects. Bonded copper interconnects test structures were created by thermocompression bonding and the bond toughness was measured using the four-point test. The effects of bonding temperature, physical bonding and failure mechanisms were investigated. The surface effects on copper surface due to pre-bond clean (with glacial acetic acid) were also looked into. A maximum average bond toughness of approximately 35 J/m² was obtained bonding temperature 300 C.

Planning and Scheduling Decisions in Supply Chains with Multiple Supply Modes: An Integrated Approach

We address the problem of jointly determining shipment planning and scheduling decisions with the presence of multiple shipment modes. We consider long lead time, less expensive sea shipment mode, and short lead time but expensive air shipment modes. Existing research on multiple shipment modes largely address the short term scheduling decisions only. Motivated by an industrial problem where planning decisions are independent of the scheduling decisions, we investigate the benefits of integrating the two sets of decisions. We develop sequence of mathematical models to address the planning and scheduling decisions. Preliminary computational results indicate improved performance of the integrated approach over some of the existing policies used in real-life situations.

Thermal Noise Behavior of the Bridge Circuit

This paper considers a connection between the deterministic and noisy behavior of nonlinear networks. Specifically, a particular bridge circuit is examined which has two possibly nonlinear energy storage elements. By proper choice of the constitutive relations for the network elements, the deterministic terminal behavior reduces to that of a single linear resistor. This reduction of the deterministic terminal behavior, in which a natural frequency of a linear circuit does not appear in the driving-point impedance, has been shown in classical circuit theory books (e.g. [1, 2]). The paper shows that, in addition to the reduction of the deterministic behavior, the thermal noise at the terminals of the network, arising from the usual Nyquist-Johnson noise model associated with each resistor in the network, is also exactly that of a single linear resistor. While this result for the linear time-invariant (LTI) case is a direct consequence of a well-known result for RLC circuits, the nonlinear result is novel. We show that the terminal noise current is precisely that predicted by the Nyquist-Johnson model for R if the driving voltage is zero or constant, but not if the driving voltage is time-dependent or the inductor and capacitor are time-varying