Laser scanning of active semiconductor devices--videotape script /

"This activity was supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards."

SERI laser scanner system /

A Laser Scanner System (LSS) produces a photoresponse map and can be used for the nondestructive detection of nonuniformities in the photoresponse of a semiconductor device. At SERI the photoresponse maps are used to identify solar cell faults including microcracks, metallization breaks, regions of poor contact between metallization and the underlying emitter surface, and variations in emitter sheet resistance.