Anomalous resistivity at the structural phase transition of polycrystalline SnTe
| Data(s) |
1979
|
|---|---|
| Resumo |
An excess resistivity has been observed in thin film polycrystalline samples of SnTe with low carrier concentration and is attributed to the additional scattering due to the phonon softening associated with the structural phase transition. |
| Formato |
application/pdf |
| Identificador | |
| Idioma(s) |
en |
| Publicador |
IOP Publishing |
| Relação |
http://eprints.ucm.es/40611/ http://iopscience.iop.org/0022-3719/12/24/001 |
| Direitos |
info:eu-repo/semantics/openAccess |
| Palavras-Chave | #Electrónica #Física de materiales |
| Tipo |
info:eu-repo/semantics/article PeerReviewed |
