Injecting multiple upsets a SEU tolerant 8051 micro-controller
| Contribuinte(s) |
DELET ; Universidade Federal do Rio Grande do Sul [Porto Alegre] (UFRGS) ASME ; ASME |
|---|---|
| Cobertura |
Ile de Bendor, France |
| Data(s) |
08/07/2002
|
| Resumo |
International audience This paper investigates the behavior of a SEU tolerant 8051-like micro-controller protected by single error correction Hamming Code in the presence of multiple upsets. Upsets were randomly injected in all sensitive parts of the design. The experiment was emulated in a Virtex FPGA platform. Results evaluate the robustness of the tolerant 8051 in a multiple upsets environment. |
| Identificador |
hal-01392537 |
| Idioma(s) |
fr |
| Publicador |
HAL CCSD IEEE |
| Direitos |
http://creativecommons.org/licenses/by-nc/ |
| Fonte |
8th IEEE International On-Line Testing Workshop (IOLT'02) https://hal.archives-ouvertes.fr/hal-01392537 8th IEEE International On-Line Testing Workshop (IOLT'02), Jul 2002, Ile de Bendor, France. IEEE, Proceedings |
| Palavras-Chave | #PACS 8542 #[SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics |
| Tipo |
info:eu-repo/semantics/conferenceObject Conference papers |
