Purification of bismuth(III) iodide for application as radiation semiconductor detector


Autoria(s): Desconhecido
Cobertura

I

Data(s)

09/11/2015

09/11/2015

31/12/1969

Identificador

http://hdl.handle.net/123456789/25141

Direitos

openAccess

Palavras-Chave #BISMUTH IODIDES #PURIFICATION #SEMICONDUCTOR MATERIALS #RADIATION DETECTORS #BRIDGMAN METHOD #CRYSTALS #EXPERIMENTAL DATA #IMPURITIES #NEUTRON ACTIVATION ANALYSIS #POWDERS #X-RAY DIFFRACTION
Tipo

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