Purification of bismuth(III) iodide for application as radiation semiconductor detector
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09/11/2015
09/11/2015
31/12/1969
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openAccess |
Palavras-Chave | #BISMUTH IODIDES #PURIFICATION #SEMICONDUCTOR MATERIALS #RADIATION DETECTORS #BRIDGMAN METHOD #CRYSTALS #EXPERIMENTAL DATA #IMPURITIES #NEUTRON ACTIVATION ANALYSIS #POWDERS #X-RAY DIFFRACTION |
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Texto completo de evento |