Multielementar segregation analysis of the thallium bromide impurities purified by repeated bridgman technique
| Cobertura |
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| Data(s) |
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31/12/1969
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| Identificador | |
| Publicador |
Sao Paulo: ABEN, 2011 |
| Direitos |
openAccess |
| Palavras-Chave | #THALIUM BROMIDES #IMPURITIES #SEMICONDUCTOR DETECTORS #CRYSTAL GROWTH #COMPARTMENTS #BRIDGMAN METHODS |
| Tipo |
Texto completo de evento |
